Articles liés à Trace-Based Post-Silicon Validation for VLSI Circuits
Synopsis
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.
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Présentation de l'éditeur
This book surveys state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits, discusses key challenges in post-silicon validation and offers automated solutions that are systematic and cost-effective.
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Trace-Based Post-Silicon Validation for VLSI Circuits
Edité par
Springer International Publishing, 2013
ISBN 10 : 3319005324
ISBN 13 : 9783319005324
Neuf
Couverture rigide
Vendeur : moluna, Greven, Allemagne
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides a comprehensive summary of state-of-the-art on post-silicon validationOffers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transferIllustrate key c. N° de réf. du vendeur 4495871
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Trace-Based Post-Silicon Validation for VLSI Circuits
Edité par
Springer International Publishing, 2013
ISBN 10 : 3319005324
ISBN 13 : 9783319005324
Neuf
Couverture rigide
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices. N° de réf. du vendeur 9783319005324
Quantité disponible : 1 disponible(s)
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Trace-Based Post-Silicon Validation for VLSI Circuits
Edité par
Springer International Publishing Jun 2013, 2013
ISBN 10 : 3319005324
ISBN 13 : 9783319005324
Neuf
Couverture rigide
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices. 124 pp. Englisch. N° de réf. du vendeur 9783319005324
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Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering, 252)
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
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Etat : New. In. N° de réf. du vendeur ria9783319005324_new
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Trace-Based Post-Silicon Validation for VLSI Circuits
ISBN 10 : 3319005324
ISBN 13 : 9783319005324
Neuf
Couverture rigide
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Buch. Etat : Neu. Neuware -This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 124 pp. Englisch. N° de réf. du vendeur 9783319005324
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TRACE BASED POST SILICON VALIDATION FOR VLSI CIRCUITS (HB 2014)
Vendeur : UK BOOKS STORE, London, LONDO, Royaume-Uni
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Etat : New. Brand New! Fast Delivery US Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 7-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability. N° de réf. du vendeur CBS 9783319005324
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Trace-Based Post-Silicon Validation for VLSI Circuits
Vendeur : Books Puddle, New York, NY, Etats-Unis
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Etat : New. pp. 126. N° de réf. du vendeur 2697562831
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TRACE BASED POST SILICON VALIDATION FOR VLSI CIRCUITS (HB 2014)
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Etat : Brand New. Brand New! Fast Delivery, Delivery With In 7-10 working Day Only , USA Edition Original Edition. Excellent Quality, Printing In English Language, Quick delivery by FEDEX & DHL. USPS & UPS Act. Our courier service is not available at PO BOX& APO BOX. Ship from India & United States. N° de réf. du vendeur CBSBOOKS44852
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Trace-Based Post-Silicon Validation for VLSI Circuits
impression à la demandeVendeur : Majestic Books, Hounslow, Royaume-Uni
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Etat : New. Print on Demand pp. 126 59 Illus. (38 Col.). N° de réf. du vendeur 94834448
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Trace-Based Post-Silicon Validation for VLSI Circuits
impression à la demandeVendeur : Biblios, Frankfurt am main, HESSE, Allemagne
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Etat : New. PRINT ON DEMAND pp. 126. N° de réf. du vendeur 1897562821
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