Autres éditions populaires du même titre
Résultats de recherche pour Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits,...
Image d'archives
Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits
Vendeur : Books in my Basket, New Delhi, Inde
Évaluation du vendeur 5 sur 5 étoiles
Soft cover. Etat : New. ISBN:9788184894295,Territorial restriction maybe printed on the book. This is an Int'l edition, ISBN and cover may differ from US edition, Contents same as US edition. N° de réf. du vendeur 2438289
Acheter neuf
EUR 7,79
Frais de port :
EUR 16
De Inde vers Etats-Unis
Quantité disponible : 2 disponible(s)
Edition internationale
DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
Edité par
New Age International Publisher, 2010
ISBN 10 : 8184894295
ISBN 13 : 9788184894295
Neuf
Couverture souple
Vendeur : Romtrade Corp., STERLING HEIGHTS, MI, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide. N° de réf. du vendeur ABNR-9155
Acheter neuf
EUR 24,96
Frais de port :
Gratuit
Vers Etats-Unis
Quantité disponible : 2 disponible(s)
Image d'archives
DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
Edité par
New Age International Publisher, 2010
ISBN 10 : 8184894295
ISBN 13 : 9788184894295
Neuf
Couverture souple
Vendeur : SMASS Sellers, IRVING, TX, Etats-Unis
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability. N° de réf. du vendeur ASNT3-9155
Acheter neuf
EUR 26,06
Frais de port :
Gratuit
Vers Etats-Unis
Quantité disponible : 2 disponible(s)
Edition internationale
DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
Edition internationaleVendeur : UK BOOKS STORE, London, LONDO, Royaume-Uni
Évaluation du vendeur 4 sur 5 étoiles
Paperback. Etat : New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 7-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability. N° de réf. du vendeur AD 9788184894295
Acheter neuf
EUR 37,82
Frais de port :
EUR 14,86
De Royaume-Uni vers Etats-Unis
Quantité disponible : 9 disponible(s)