Glatzel, thilo (58 résultats)

Etat : New.

Etat : New.

Etat : New. A brand new book in pristine condition. Showing zero signs of shelf wear, creases, or damage.

Etat : New.

Etat : New.

Etat : New. In English.

Gebunden. Etat : New.

Etat : New.

Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.…

Etat : New. pp. 348.

Etat : New. pp. 348.

Taschenbuch. Etat : Neu. Kelvin Probe Force Microscopy | Measuring and Compensating Electrostatic Forces | Sascha Sadewasser (u. a.) | Taschenbuch | Springer Series in Surface Sciences | xiv | Englisch | 2013 | Springer | EAN 9783642271137 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Paperback. Etat : Brand New. 2012 edition. 290 pages. 9.25x6.10x0.79 inches. In Stock.

Hardcover. Etat : Brand New. 2012 edition. 345 pages. 9.25x6.25x1.00 inches. In Stock.

Etat : New. In English.

Etat : As New. Unread book in perfect condition.

Hardcover. Etat : Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Paperback. Etat : Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Etat : As New. Unread book in perfect condition.

Etat : As New. Unread book in perfect condition.

Etat : New. In English.

Etat : New. In English.

Hardcover. Etat : Gut. xxiv, 521 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library in GOOD condition with library-signature and stamp(s). Some traces of use. R-16212 9783319756868 Sprache: Englisch Gewicht in Gramm: 1050.

Etat : New.

Etat : New.

Taschenbuch. Etat : Neu. Kelvin Probe Force Microscopy | From Single Charge Detection to Device Characterization | Sascha Sadewasser (u. a.) | Taschenbuch | Springer Series in Surface Sciences | xxiv | Englisch | 2019 | Springer | EAN 9783030092986 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Etat : As New. Unread book in perfect condition.

Etat : As New. Unread book in perfect condition.

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume 'Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,' presents new and complementary topics.It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field. …

Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume 'Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,' presents new and complementary topics.It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.…