Lucille a. giannuzzi (27 résultats)

Etat : New.

Etat : New. In English.

Etat : As New. Unread book in perfect condition.

Etat : New.

Etat : As New. Unread book in perfect condition.

Taschenbuch. Etat : Neu. Introduction to Focused Ion Beams | Instrumentation, Theory, Techniques and Practice | Lucille A Giannuzzi (u. a.) | Taschenbuch | xvii | Englisch | 2010 | Springer Us | EAN 9781441935748 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Etat : New. In English.

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.…

Etat : New.

Hardback. Etat : New. 2005 ed. Introduction to Focused Ion Beams is geared towards techniques and applications. The first portion of this book introduces the basics of FIB instrumentation, milling, and deposition capabilities. The chapter dedicated to ion-solid interactions is presented so that the FIB user can understand which parameters will influence FIB milling behavior. The remainder of the book focuses on how to prepare and analyze samples using FIB and related tools, and presents specific applications and techniques of the uses of FIB milling, deposition, and dual platform techniques. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and Dual platform instruments.…

Etat : New. pp. 378.

Etat : New.

Etat : As New. Unread book in perfect condition.

Etat : New. pp. 378.

Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.…

Hardback. Etat : New. 2005 ed. Introduction to Focused Ion Beams is geared towards techniques and applications. The first portion of this book introduces the basics of FIB instrumentation, milling, and deposition capabilities. The chapter dedicated to ion-solid interactions is presented so that the FIB user can understand which parameters will influence FIB milling behavior. The remainder of the book focuses on how to prepare and analyze samples using FIB and related tools, and presents specific applications and techniques of the uses of FIB milling, deposition, and dual platform techniques. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and Dual platform instruments.…

Etat : new. Questo è un articolo print on demand.

Paperback / softback. Etat : New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.

Kartoniert / Broschiert. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Only text that discusses and presents the theory directly related to applications and the only one that disscusses the vast applications and techniques used in FIBs and dual platform instrumentsOnly text that discusses and presents the theory directl.…

Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments. 357 pp. Englisch.…

Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Only text that discusses and presents the theory directly related to applications and the only one that disscusses the vast applications and techniques used in FIBs and dual platform instrumentsOnly text that discusses and presents the theory directl.…

Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments. 376 pp. Englisch.…

Etat : New. Print on Demand pp. 378 193 Illus.

Etat : New. PRINT ON DEMAND pp. 378.

Buch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -Introduction to Focused Ion Beams is geared towards techniques and applications. The first portion of this book introduces the basics of FIB instrumentation, milling, and deposition capabilities. The chapter dedicated to ion-solid interactions is presented so that the FIB user can understand which parameters will influence FIB milling behavior. The remainder of the book focuses on how to prepare and analyze samples using FIB and related tools, and presents specific applications and techniques of the uses of FIB milling, deposition, and dual platform techniques. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and Dual platform instrumentsSpringer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 376 pp. Englisch.…

Etat : New. Print on Demand pp. 378 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.

Etat : New. PRINT ON DEMAND pp. 378.