Duane boning (35 résultats)

Hardcover. Etat : Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Etat : New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Etat : New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.

Etat : New. pp. 328.

Etat : New. pp. 328 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.

Etat : New. pp. 328.

Etat : New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

hardcover. Etat : New. In shrink wrap. Looks like an interesting title.

Hardcover. Etat : Very Good. 1. Auflage. unread, mimimum of shelfwear.

Etat : New. In English.

Etat : New. In English.

Etat : New. pp. 332.

Etat : New.

Hardcover. Etat : Brand New. 1st edition. 310 pages. 9.25x6.25x0.75 inches. In Stock.

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to understanding the causes of variability; design of test structures for variability characterization; statistically rigorous data analysis;techniques of design for manufacturability in lithography and in chemical mechanical polishing;statistical simulation, analysis, and optimization techniques for improving parametric yield.Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be masteredfor state-of-the-art design for manufacturability and statistical design methodologies. It is animportant reference for practitioners and students in the field of computer-aided design of integrated circuits. …

Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to understanding the causes of variability; design of test structures for variability characterization; statistically rigorous data analysis;techniques of design for manufacturability in lithography and in chemical mechanical polishing;statistical simulation, analysis, and optimization techniques for improving parametric yield.Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be masteredfor state-of-the-art design for manufacturability and statistical design methodologies. It is animportant reference for practitioners and students in the field of computer-aided design of integrated circuits.…

Etat : New. In English.

Etat : New.

Etat : New. Offers analyses of run-to-run (R2R) control. Through manufacturing case studies, this book provides justification for and demonstrates the benefits of run-to-run control, and offers the know-how and direction for incorporating R2R control into readers' manufacturing capabilities. Editor(s): Moyne, James; del Castillo, Enrique; Hurwitz, A.M. Num Pages: 368 pages, 27 black & white tables. BIC Classification: TGP; TJFD5. Category: (P) Professional & Vocational. Dimension: 242 x 158 x 22. Weight in Grams: 630. . 2000. 1st Edition. hardcover. . . . . …

Etat : New.

Paperback. Etat : Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Hardcover. Etat : Brand New. 718 pages. 9.25x6.10x1.89 inches. In Stock.

Etat : New. Offers analyses of run-to-run (R2R) control. Through manufacturing case studies, this book provides justification for and demonstrates the benefits of run-to-run control, and offers the know-how and direction for incorporating R2R control into readers' manufacturing capabilities. Editor(s): Moyne, James; del Castillo, Enrique; Hurwitz, A.M. Num Pages: 368 pages, 27 black & white tables. BIC Classification: TGP; TJFD5. Category: (P) Professional & Vocational. Dimension: 242 x 158 x 22. Weight in Grams: 630. . 2000. 1st Edition. hardcover. . . . . Books ship from the US and Ireland. …

Etat : New.

Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides readers with an up-to-date account of the use of machine learning frameworks, methodologies, algorithms and techniques in the context of computer-aided design (CAD) for very-large-scale integrated circuits (VLSI). Coverage includes the various machine learning methods used in lithography, physical design, yield prediction, post-silicon performance analysis, reliability and failure analysis, power and thermal analysis, analog design, logic synthesis, verification, and neuromorphic design. Provides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability;Discusses the use of machine learning techniques in the context of analog and digital synthesis;Demonstrates how to formulate VLSI CAD objectives as machine learning problems and provides a comprehensive treatment of their efficient solutions;Discusses the tradeoff between the cost of collecting data and prediction accuracy and provides a methodology for using prior data to reduce cost of data collection in the design, testing and validation of both analog and digital VLSI designs.From the Foreword As the semiconductor industry embraces the rising swell of cognitive systems and edge intelligence, this book could serve as a harbinger and example of the osmosis that will exist between our cognitive structures and methods, on the one hand, and the hardware architectures and technologies that will support them, on the other.As we transition from the computing era to the cognitive one, it behooves us to remember the success story of VLSI CAD and to earnestly seek the help of the invisible hand so that our future cognitive systems are used to design more powerful cognitive systems. This book is very much aligned with this on-going transition from computing to cognition, and it is with deep pleasure thatI recommend it to all those who are actively engaged in this exciting transformation.Dr. Ruchir Puri, IBM Fellow, IBM Watson CTO & Chief Architect, IBM T. J. Watson Research Center.…

Etat : new. Questo è un articolo print on demand.

Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Unified Treatment of Data Collection, Modeling, and Statistical CADCovers From Fabrication to Design to CADDeals With the Extraction of Fab Information into distrubutions for analysisCircuit Structures and Techniques to Reduce On-Chi.…

Gebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Unified Treatment of Data Collection, Modeling, and Statistical CADCovers From Fabrication to Design to CADDeals With the Extraction of Fab Information into distrubutions for analysisCircuit Structures and Techniques to Reduce On-Chi.…

Etat : New. Print on Demand pp. 332 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.

Gebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability Discusses the use of machine learning techniques in the context of analog and di.…