Lelay (34 résultats)

Etat : Good. PLEASE NOTE: FORMER LIBRARY BOOK. IT MAY HAVE IDENTIFYING STAMPS, MARKS, STICKERS, ETC. COVER SHOWS SOME GENERAL WEAR, SUCH AS SCRATCHES, RUBBING AND CREASES. Former Library book. paperback 100% of proceeds go to charity! Good condition with all pages in tact. Item shows signs of use and may have cosmetic defects. Lelay, Fabian (illustrateur).…

Etat : Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good. Lelay, Fabian (illustrateur). …

paperback. Etat : Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority. Lelay, Fabian (illustrateur).

Etat : As New. Unread copy in mint condition. Lelay, Fabian; Wu, Annie (illustrateur).

Etat : New. Lelay, Fabian (illustrateur).

Paperback. Etat : New. Lelay, Fabian (illustrateur).

Etat : New. Lelay, Fabian; Wu, Annie (illustrateur).

Paperback. Etat : New. Lelay, Fabian; Wu, Annie (illustrateur).

Etat : As New. Unread copy in mint condition. Lelay, Fabian (illustrateur).

paperback. Etat : Very Good. Most items will be dispatched the same or the next working day. A copy that has been read, but is in excellent condition. Pages are intact and not marred by notes or highlighting. The spine remains undamaged. Lelay, Fabian; Wu, Annie (illustrateur).

Etat : very good. Gut/Very good: Buch bzw. Schutzumschlag mit wenigen Gebrauchsspuren an Einband, Schutzumschlag oder Seiten. / Describes a book or dust jacket that does show some signs of wear on either the binding, dust jacket or pages.

Paperback. Etat : Brand New. 128 pages. 10.00x6.50x0.25 inches. In Stock. Lelay, Fabian (illustrateur).

Paperback. Etat : Brand New. 110 pages. 10.25x6.75x0.50 inches. In Stock. Lelay, Fabian; Wu, Annie (illustrateur).

Paperback. Etat : New. Lelay, Fabian (illustrateur).

Paperback. Etat : New. Lelay, Fabian; Wu, Annie (illustrateur).

Etat : As New. Unread book in perfect condition.

Etat : Used: Very Good. Occasion - Très Bon Etat - Savoir rédiger (1997) - Grand Format.

Etat : Used: Acceptable. Occasion - Etat Correct - Savoir rédiger (1997) - Grand Format.

Etat : fine. vendeur professionnel. envoi soigne en 24/48h. le livre peut presenter de tres legers signes d'usure, petites rayures ou imperfections esthetiques.

Etat : New.

Etat : New.

Etat : As New. Unread book in perfect condition.

Etat : fine. vendeur professionnel. envoi soigne en 24/48h. le livre peut presenter de tres legers signes d'usure, petites rayures ou imperfections esthetiques.

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently been achieved in the elaboration of new thin film materials and in the characterization of their interfacial properties, down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures that were given at the International Winter School on Semiconductor Interfaces: Formation and Properties held at the Centre de Physique des Rouches from 24 February to 6 March, 1987. The aim of this Winter School was to present a comprehensive review of this field, in particular of the materials and methods, and to formulate recom mendations for future research. The following topics are treated: (i) Interface formation. The key aspects of molecular beam epitaxy are emphasized, as well as the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. (ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure. (iii) Specific physical properties of the interfaces and their prospective applications in devices. We wish to thank warmly all the lecturers and participants, as well as the organizing committee, who made this Winter School a success.…

Etat : New. pp. 408.

Paperback. Etat : Brand New. reprint edition. 400 pages. 9.60x6.80x1.00 inches. In Stock.

Etat : Used: Like New. LIVRE A L?ETAT DE NEUF. EXPEDIE SOUS 3 JOURS OUVRES. NUMERO DE SUIVI COMMUNIQUE AVANT ENVOI, EMBALLAGE RENFORCE. EAN:9782492926310.

Couverture rigide. Etat : Bon. In4, relié format oblong, bon état, 1998, 120 pages, (traces ou marques éparses en reliure, coupure au bas de 2 pages 8 et 10). Envoi soigné.

Etat : new. Questo è un articolo print on demand.

Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently been achieved in the elaboration of new thin film materials and in the characterization of their interfacial properties, down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures that were given at the International Winter School on Semiconductor Interfaces: Formation and Properties held at the Centre de Physique des Rouches from 24 February to 6 March, 1987. The aim of this Winter School was to present a comprehensive review of this field, in particular of the materials and methods, and to formulate recom mendations for future research. The following topics are treated: (i) Interface formation. The key aspects of molecular beam epitaxy are emphasized, as well as the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. (ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure. (iii) Specific physical properties of the interfaces and their prospective applications in devices. We wish to thank warmly all the lecturers and participants, as well as the organizing committee, who made this Winter School a success. 408 pp. Englisch.…