Rubak ege (14 résultats)

Langue : anglais
Edité par Chapman and Hall/CRC, 2015
Série : Livre 1 sur 1 - Chapman & Hall/CRC Interdisciplinary Statistics
- Couverture rigide
Vendeur : GreatBookPrices, Columbia, MD, Etats-UnisGreatBookPrices
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Occasion - Comme neuf
EUR 160,20
EUR 2,35 expéditionExpédition nationale : Etats-UnisQuantité disponible : Plus de 20 disponibles
Etat : As New. Unread book in perfect condition.

Langue : anglais
Edité par Chapman and Hall/CRC, 2015
Série : Livre 1 sur 1 - Chapman & Hall/CRC Interdisciplinary Statistics
- Couverture rigide
Vendeur : GreatBookPricesUK, Woodford Green, Royaume-UniGreatBookPricesUK
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Occasion - Comme neuf
EUR 156,53
EUR 17,60 expéditionExpédition depuis Royaume-Uni vers Etats-UnisQuantité disponible : 10 disponibles
Etat : As New. Unread book in perfect condition.

Langue : anglais
Edité par Chapman and Hall/CRC, 2015
Série : Livre 1 sur 1 - Chapman & Hall/CRC Interdisciplinary Statistics
- Couverture rigide
Vendeur : GreatBookPrices, Columbia, MD, Etats-UnisGreatBookPrices
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 172,30
EUR 2,35 expéditionExpédition nationale : Etats-UnisQuantité disponible : Plus de 20 disponibles
Etat : New.

Langue : anglais
Edité par Chapman and Hall/CRC, 2015
Série : Livre 1 sur 1 - Chapman & Hall/CRC Interdisciplinary Statistics
- Couverture rigide
Vendeur : GreatBookPricesUK, Woodford Green, Royaume-UniGreatBookPricesUK
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 175,91
EUR 17,60 expéditionExpédition depuis Royaume-Uni vers Etats-UnisQuantité disponible : 10 disponibles
Etat : New.

Langue : anglais
Edité par Chapman and Hall/CRC, 2015
Série : Livre 1 sur 1 - Chapman & Hall/CRC Interdisciplinary Statistics
- Couverture rigide
Vendeur : California Books, Miami, FL, Etats-UnisCalifornia Books
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 194,13
Frais de port gratuitsExpédition nationale : Etats-UnisQuantité disponible : Plus de 20 disponibles
Etat : New.

Langue : anglais
Edité par Taylor & Francis Group, 2015
Série : Livre 1 sur 1 - Chapman & Hall/CRC Interdisciplinary Statistics
- Couverture rigide
Vendeur : Books Puddle, Woodside, NY, Etats-UnisBooks Puddle
Contacter le vendeurVendeur avec une évaluation de 4 étoilesEtat: Neuf
EUR 201,41
EUR 3,55 expéditionExpédition nationale : Etats-UnisQuantité disponible : 3 disponibles
Etat : New. pp. 400.

Langue : anglais
Edité par Taylor & Francis Group, 2015
Série : Livre 1 sur 1 - Chapman & Hall/CRC Interdisciplinary Statistics
- Couverture rigide
Vendeur : Biblios, frankfurt am main, HESSE, AllemagneBiblios
Contacter le vendeurVendeur avec une évaluation de 4 étoilesEtat: Neuf
EUR 196,79
EUR 9,95 expéditionExpédition depuis Allemagne vers Etats-UnisQuantité disponible : 3 disponibles
Etat : New. pp. 400.

Langue : anglais
Edité par Chapman and Hall/CRC, 2015
Série : Livre 1 sur 1 - Chapman & Hall/CRC Interdisciplinary Statistics
- Couverture rigide
Vendeur : Ria Christie Collections, Uxbridge, Royaume-UniRia Christie Collections
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 197,96
EUR 17,53 expéditionExpédition depuis Royaume-Uni vers Etats-UnisQuantité disponible : Plus de 20 disponibles
Etat : New. In English.

Langue : anglais
Edité par Taylor and Francis Inc, US, 2015
Série : Livre 1 sur 1 - Chapman & Hall/CRC Interdisciplinary Statistics
- Couverture rigide
Vendeur : Rarewaves.com USA, London, LONDO, Royaume-UniRarewaves.com USA
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 240,60
Frais de port gratuitsExpédition depuis Royaume-Uni vers Etats-UnisQuantité disponible : Plus de 20 disponibles
Hardback. Etat : New. Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional "structure," such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter.…

Langue : anglais
Edité par Chapman & Hall, 2015
Série : Livre 1 sur 1 - Chapman & Hall/CRC Interdisciplinary Statistics
- Couverture rigide
Vendeur : Revaluation Books, Exeter, Royaume-UniRevaluation Books
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 250,15
EUR 23,47 expéditionExpédition depuis Royaume-Uni vers Etats-UnisQuantité disponible : 2 disponibles
Hardcover. Etat : Brand New. 810 pages. 9.00x7.00x2.00 inches. In Stock.

Langue : anglais
Edité par Taylor and Francis Inc, US, 2015
Série : Livre 1 sur 1 - Chapman & Hall/CRC Interdisciplinary Statistics
- Couverture rigide
Vendeur : Rarewaves.com UK, London, Royaume-UniRarewaves.com UK
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 235,59
EUR 76,27 expéditionExpédition depuis Royaume-Uni vers Etats-UnisQuantité disponible : Plus de 20 disponibles
Hardback. Etat : New. Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional "structure," such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter.…

Langue : anglais
Edité par Taylor & Francis Group, 2015
Série : Livre 1 sur 1 - Chapman & Hall/CRC Interdisciplinary Statistics
- Couverture rigide
- impression à la demande
Vendeur : Majestic Books, Hounslow, Royaume-UniMajestic Books
Contacter le vendeurVendeur avec une évaluation de 4 étoilesEtat: Neuf
EUR 166,87
EUR 7,63 expéditionExpédition depuis Royaume-Uni vers Etats-UnisQuantité disponible : 3 disponibles
Etat : New. pp. 400 This item is printed on demand.

Langue : anglais
Edité par Chapman And Hall/CRC Nov 2015, 2015
Série : Livre 1 sur 1 - Chapman & Hall/CRC Interdisciplinary Statistics
- Couverture rigide
- impression à la demande
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AllemagneBuchWeltWeit Ludwig Meier e.K.
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 155,50
EUR 23,00 expéditionExpédition depuis Allemagne vers Etats-UnisQuantité disponible : 2 disponibles
Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional 'structure,' such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter. 830 pp. Englisch.…

Langue : anglais
Edité par Chapman And Hall/CRC, 2015
Série : Livre 1 sur 1 - Chapman & Hall/CRC Interdisciplinary Statistics
- Couverture rigide
- impression à la demande
Vendeur : AHA-BUCH GmbH, Einbeck, AllemagneAHA-BUCH GmbH
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 173,44
EUR 47,08 expéditionExpédition depuis Allemagne vers Etats-UnisQuantité disponible : 1 disponible
Buch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Modern Statistical Methodology and Software for Analyzing Spatial Point PatternsSpatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data. Making the techniques accessible to non-mathematicians, the authors draw on their 25 years of software development experiences, methodological research, and broad scientific collaborations to deliver a book that clearly and succinctly explains concepts and addresses real scientific questions.Practical Advice on Data Analysis and Guidance on the Validity and Applicability of MethodsThe first part of the book gives an introduction to R software, advice about collecting data, information about handling and manipulating data, and an accessible introduction to the basic concepts of point processes. The second part presents tools for exploratory data analysis, including non-parametric estimation of intensity, correlation, and spacing properties. The third part discusses model-fitting and statistical inference for point patterns. The final part describes point patterns with additional 'structure,' such as complicated marks, space-time observations, three- and higher-dimensional spaces, replicated observations, and point patterns constrained to a network of lines.Easily Analyze Your Own DataThroughout the book, the authors use their spatstat package, which is free, open-source code written in the R language. This package provides a wide range of capabilities for spatial point pattern data, from basic data handling to advanced analytic tools. The book focuses on practical needs from the user's perspective, offering answers to the most frequently asked questions in each chapter.…