Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
EUR 114,38
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Ajouter au panierEtat : New. In.
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Ajouter au panierEtat : New.
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Ajouter au panierHardcover. Etat : Brand New. 517 pages. 9.25x6.25x1.50 inches. In Stock.
Langue: anglais
Edité par Springer International Publishing, Springer Nature Switzerland, 2014
ISBN 10 : 3319089935 ISBN 13 : 9783319089935
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
EUR 117,69
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Ajouter au panierBuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today's most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy ('become hot'), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
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Ajouter au panierHardcover. Etat : Like New. Like New. book.
Vendeur : Brook Bookstore On Demand, Napoli, NA, Italie
EUR 94,25
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Ajouter au panierEtat : new. Questo è un articolo print on demand.
Langue: anglais
Edité par Springer International Publishing, Springer Nature Switzerland Nov 2014, 2014
ISBN 10 : 3319089935 ISBN 13 : 9783319089935
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
EUR 117,69
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Ajouter au panierBuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today's most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy ('become hot'), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance. 528 pp. Englisch.
Langue: anglais
Edité par Springer International Publishing, 2014
ISBN 10 : 3319089935 ISBN 13 : 9783319089935
Vendeur : moluna, Greven, Allemagne
EUR 98,54
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Ajouter au panierGebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Describes the intricacies of hot carrier degradation in modern semiconductor technologiesCovers the entire hot carrier degradation phenomenon, including topics such as characterization, carrier transport, carrier-defect interaction, technological .
Vendeur : Majestic Books, Hounslow, Royaume-Uni
EUR 166,22
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Ajouter au panierEtat : New. Print on Demand.
Langue: anglais
Edité par Springer, Palgrave Macmillan Nov 2014, 2014
ISBN 10 : 3319089935 ISBN 13 : 9783319089935
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
EUR 117,69
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Ajouter au panierBuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today¿s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (¿become hot¿), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 528 pp. Englisch.
Vendeur : Biblios, Frankfurt am main, HESSE, Allemagne
EUR 172,01
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Ajouter au panierEtat : New. PRINT ON DEMAND.