Advanced scanning electron microscopy par echlin patrick (14 résultats)
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Hardcover. Etat : Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Echlin, Patrick, Fiori, C.E., Goldstein, Joseph, Joy, David C., Newbury, Dale E.
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Vendeur : Zubal-Books, Since 1961, Cleveland, OH, Etats-UnisZubal-Books, Since 1961
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Etat : Good. Second printing, 454 pp., hardcover, ex library, else text clean and binding tight (lacks dust jacket). - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by re…cipient's country.
Advanced Scanning Electron Microscopy And X-ray Microanalysis
Echlin, Patrick; Fiori, C.E.; Goldstein, Joseph; Joy, David C.; Newbury, Dale E.
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Vendeur : Romtrade Corp., STERLING HEIGHTS, MI, Etats-UnisRomtrade Corp.
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EUR 111,26
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Etat : New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Echlin, Patrick; Fiori, C.E.; Goldstein, Joseph; Joy, David C.; Newbury, Dale E.
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Vendeur : Ria Christie Collections, Uxbridge, Royaume-UniRia Christie Collections
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EUR 116,26
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Etat : New. In.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin|C.E. Fiori|Joseph Goldstein|David C. Joy|Dale E. Newbury
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Vendeur : moluna, Greven, Allemagnemoluna
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EUR 92,27
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Etat : New.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Dale E. Newbury David C. Joy Joseph Goldstein C.E. Fiori Patrick Echlin
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Vendeur : Books Puddle, New York, NY, Etats-UnisBooks Puddle
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EUR 153,93
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Etat : Used. pp. xii + 454.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Newbury Dale E. Joy David C. Goldstein Joseph Fiori C.E. Echlin Patrick
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Vendeur : Majestic Books, Hounslow, Royaume-UniMajestic Books
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EUR 157,12
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Etat : Used. pp. xii + 454.
Advanced Scanning Electron Microscopy and X-ray Microanalysis
Echlin, Patrick/ Fiori, C. E./ Goldstein, Joseph/ Joy, David C./ Newbury, Dale E.
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Vendeur : Revaluation Books, Exeter, Royaume-UniRevaluation Books
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EUR 154,98
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Paperback. Etat : Brand New. reprint edition. 466 pages. 8.75x6.00x0.75 inches. In Stock.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Newbury Dale E. Joy David C. Goldstein Joseph Fiori C.E. Echlin Patrick
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Vendeur : Biblios, frankfurt am main, HESSE, AllemagneBiblios
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EUR 159,88
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Etat : Used. pp. xii + 454.
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Vendeur : Mispah books, Redhill, SURRE, Royaume-UniMispah books
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EUR 213,59
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Hardcover. Etat : Very Good. Dust Jacket may NOT BE INCLUDED.CDs may be missing. SHIPS FROM MULTIPLE LOCATIONS. book.
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Vendeur : Brook Bookstore On Demand, Napoli, NA, ItalieBrook Bookstore On Demand
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Etat : new. Questo è un articolo print on demand.
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Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AllemagneBuchWeltWeit Ludwig Meier e.K.
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EUR 106,99
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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials p…resented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course. 476 pp. Englisch.
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Vendeur : preigu, Osnabrück, Allemagnepreigu
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EUR 95,70
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Taschenbuch. Etat : Neu. Advanced Scanning Electron Microscopy and X-Ray Microanalysis | Patrick Echlin (u. a.) | Taschenbuch | xii | Englisch | 2013 | Humana | EAN 9781475790290 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: pr…eigu Print on Demand.
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EUR 106,99
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Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials prese…nted in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 476 pp. Englisch.
