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Edité par Springer-Verlag New York Inc., New York, 2014
ISBN 10 : 1489989390 ISBN 13 : 9781489989390
Langue: anglais
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Ajouter au panierPaperback. Etat : new. Paperback. Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instruments capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopyincluding field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. This book covers all facets of atom probe microscopyincluding field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Edité par Springer-Verlag New York Inc., New York, NY, 2012
ISBN 10 : 1461434351 ISBN 13 : 9781461434351
Langue: anglais
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Ajouter au panierHardcover. Etat : new. Hardcover. Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instruments capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopyincluding field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. This book covers all facets of atom probe microscopyincluding field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Vendeur : California Books, Miami, FL, Etats-Unis
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Edité par Springer New York, Springer New York Mai 2012, 2012
ISBN 10 : 1461434351 ISBN 13 : 9781461434351
Langue: anglais
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
EUR 267,49
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Ajouter au panierBuch. Etat : Neu. Neuware -Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument¿s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy¿including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 420 pp. Englisch.
Edité par Springer New York, Springer US Jun 2014, 2014
ISBN 10 : 1489989390 ISBN 13 : 9781489989390
Langue: anglais
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
EUR 267,49
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Ajouter au panierTaschenbuch. Etat : Neu. Neuware -Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument¿s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy¿including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 420 pp. Englisch.
Edité par Springer New York, Springer US, 2014
ISBN 10 : 1489989390 ISBN 13 : 9781489989390
Langue: anglais
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
EUR 270,70
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Ajouter au panierTaschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.
Edité par Springer New York, Springer New York, 2012
ISBN 10 : 1461434351 ISBN 13 : 9781461434351
Langue: anglais
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
EUR 270,70
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Ajouter au panierBuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
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Edité par Springer-Verlag New York Inc., New York, 2014
ISBN 10 : 1489989390 ISBN 13 : 9781489989390
Langue: anglais
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Ajouter au panierPaperback. Etat : new. Paperback. Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instruments capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopyincluding field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. This book covers all facets of atom probe microscopyincluding field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
Edité par Springer-Verlag New York Inc., New York, NY, 2012
ISBN 10 : 1461434351 ISBN 13 : 9781461434351
Langue: anglais
Vendeur : AussieBookSeller, Truganina, VIC, Australie
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Ajouter au panierHardcover. Etat : new. Hardcover. Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instruments capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopyincluding field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. This book covers all facets of atom probe microscopyincluding field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
ISBN 10 : 7030474260 ISBN 13 : 9787030474261
Vendeur : liu xing, Nanjing, JS, Chine
EUR 140,40
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Ajouter au panierpaperback. Etat : New. Paperback. Pub Date: 2016-03-01 Pages: 326 Language: Chinese Publisher: science press co. LTD. the atom probe microscopy includes theoretical basis. practical aspects of atom probe and its application in material science three parts. first summarizes the development course of atom probe technology. introduces the prototype of atom probe field from.
Edité par Springer New York, Chapman And Hall/CRC Jun 2014, 2014
ISBN 10 : 1489989390 ISBN 13 : 9781489989390
Langue: anglais
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
EUR 267,49
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Ajouter au panierTaschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. 420 pp. Englisch.
Edité par Springer New York, Chapman And Hall/CRC Mai 2012, 2012
ISBN 10 : 1461434351 ISBN 13 : 9781461434351
Langue: anglais
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
EUR 267,49
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Ajouter au panierBuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. 420 pp. Englisch.
Vendeur : Majestic Books, Hounslow, Royaume-Uni
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Ajouter au panierEtat : New. Print on Demand pp. 422.
Vendeur : Biblios, Frankfurt am main, HESSE, Allemagne
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Ajouter au panierEtat : New. PRINT ON DEMAND pp. 422.