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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500? (Frontiers in Electronic Testing, 35)
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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500 (Frontiers in Electronic Testing, 35)
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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500 (Frontiers in Electronic Testing, 35)
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The Core Test Wrapper Handbook: Rationale And Application Of Ieee Std. 1500 (frontiers In Electronic Testing)
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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500 (Frontiers in Electronic Testing, 35)
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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500? (Frontiers in Electronic Testing, 35)
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The Core Test Wrapper Handbook
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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500? (Frontiers in Electronic Testing, 35)
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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500? (Frontiers in Electronic Testing, 35)
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The Core Test Wrapper Handbook
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Ajouter au panierEtat : New. pp. 312 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
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The Core Test Wrapper Handbook
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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500? (Frontiers in Electronic Testing, 35)
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The Core Test Wrapper Handbook: Rationale and Application.
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Ajouter au panierEtat : New. pp. 308.
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Core Test Wrapper Handbook : Rationale and Application of IEEE Std. 1500
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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500? (Frontiers in Electronic Testing, 35)
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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500? (Frontiers in Electronic Testing, 35)
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Core Test Wrapper Handbook : Rationale and Application of IEEE Std. 1500
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Core Test Wrapper Handbook : Rationale and Application of IEEE Std. 1500
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The Core Test Wrapper Handbook : Rationale and Application of IEEE Std. 1500¿
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
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Ajouter au panierTaschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to become a tens-of-dollars embedded core. I ran into first hand the problem of trying to deliver what used to be a whole chip with something on the order of over 400 interconnect signals to a design team that was going to stuff it into a package with less than 220 signal pins and surround it with other logic. I also ran into the problem of delivering microprocessor specification verifi- tion - a microprocessor is not just about the functions and instructions included with the instruction set, but also the MIPs rating at some given f- quency. I faced two dilemmas: one, I could not deliver functional vectors without significant development of off-core logic to deal with the reduced chip I/O map (and everybody's I/O map was going to be a little different); and two, the JTAG (1149. 1) boundary scan ring that was around my core when it was a chip was going to be woefully inadequate since it did not support - speed signal application and capture and independent use separate from my core. I considered the problem at length and came up with my own solution that was predominantly a separate non-JTAG scan test wrapper that supported at-speed application of launch-capture cycles using the system clock. But my problems weren't over at that point either.
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Core Test Wrapper Handbook : Rationale and Application of IEEE Std. 1500
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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500 (Frontiers in Electronic Testing, 35)
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Ajouter au panierPaperback. Etat : Like New. Like New. book.
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The Core Test Wrapper Handbook
Edité par Springer-Verlag New York Inc., US, 2006
ISBN 10 : 0387307516 ISBN 13 : 9780387307510
Langue: anglais
Vendeur : Rarewaves.com USA, London, LONDO, Royaume-Uni
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Ajouter au panierHardback. Etat : New. 2006 ed. In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to become a tens-of-dollars embedded core. I ran into first hand the problem of trying to deliver what used to be a whole chip with something on the order of over 400 interconnect signals to a design team that was going to stuff it into a package with less than 220 signal pins and surround it with other logic. I also ran into the problem of delivering microprocessor specification verifi- tion - a microprocessor is not just about the functions and instructions included with the instruction set, but also the MIPs rating at some given f- quency. I faced two dilemmas: one, I could not deliver functional vectors without significant development of off-core logic to deal with the reduced chip I/O map (and everybody's I/O map was going to be a little different); and two, the JTAG (1149. 1) boundary scan ring that was around my core when it was a chip was going to be woefully inadequate since it did not support - speed signal application and capture and independent use separate from my core. I considered the problem at length and came up with my own solution that was predominantly a separate non-JTAG scan test wrapper that supported at-speed application of launch-capture cycles using the system clock. But my problems weren't over at that point either.
-
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Ajouter au panierGebunden. Etat : New. Guides engineers through the process of building a 1500 wrapperProvides insight into the rules and recommendations of IEEE Std. 1500 Focus on practical design considerations inherent to the application of IEEE Std. 1500 by discussing design choice.
-
The Core Test Wrapper Handbook
Edité par Springer-Verlag New York Inc., US, 2006
ISBN 10 : 0387307516 ISBN 13 : 9780387307510
Langue: anglais
Vendeur : Rarewaves.com UK, London, Royaume-Uni
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EUR 214,53
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Ajouter au panierHardback. Etat : New. 2006 ed. In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to become a tens-of-dollars embedded core. I ran into first hand the problem of trying to deliver what used to be a whole chip with something on the order of over 400 interconnect signals to a design team that was going to stuff it into a package with less than 220 signal pins and surround it with other logic. I also ran into the problem of delivering microprocessor specification verifi- tion - a microprocessor is not just about the functions and instructions included with the instruction set, but also the MIPs rating at some given f- quency. I faced two dilemmas: one, I could not deliver functional vectors without significant development of off-core logic to deal with the reduced chip I/O map (and everybody's I/O map was going to be a little different); and two, the JTAG (1149. 1) boundary scan ring that was around my core when it was a chip was going to be woefully inadequate since it did not support - speed signal application and capture and independent use separate from my core. I considered the problem at length and came up with my own solution that was predominantly a separate non-JTAG scan test wrapper that supported at-speed application of launch-capture cycles using the system clock. But my problems weren't over at that point either.
-
The Core Test Wrapper Handbook : Rationale and Application of IEEE Std. 1500(tm)
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
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EUR 247,94
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Ajouter au panierBuch. Etat : Neu. Neuware - In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to become a tens-of-dollars embedded core. I ran into first hand the problem of trying to deliver what used to be a whole chip with something on the order of over 400 interconnect signals to a design team that was going to stuff it into a package with less than 220 signal pins and surround it with other logic. I also ran into the problem of delivering microprocessor specification verifi- tion - a microprocessor is not just about the functions and instructions included with the instruction set, but also the MIPs rating at some given f- quency. I faced two dilemmas: one, I could not deliver functional vectors without significant development of off-core logic to deal with the reduced chip I/O map (and everybody's I/O map was going to be a little different); and two, the JTAG (1149. 1) boundary scan ring that was around my core when it was a chip was going to be woefully inadequate since it did not support - speed signal application and capture and independent use separate from my core. I considered the problem at length and came up with my own solution that was predominantly a separate non-JTAG scan test wrapper that supported at-speed application of launch-capture cycles using the system clock. But my problems weren't over at that point either.
-
The Core Test Wrapper Handbook
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
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Ajouter au panierTaschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500tm provides insight into the rules and recommendations of IEEE Std. 1500. This book focuses on practical design considerations inherent to the application of IEEE Std. 1500 by discussing design choices and other decisions relevant to this IEEE standard. The authors provide background information about some of the choices and decisions made throughout the design of IEEE Std. 1500. 308 pp. Englisch.
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Ajouter au panierEtat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Guides engineers through the process of building a 1500 wrapperProvides insight into the rules and recommendations of IEEE Std. 1500 Focus on practical design considerations inherent to the application of IEEE Std. 1500 by discussing design choice.
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The Core Test Wrapper Handbook: Rationale and Application.
Vendeur : Majestic Books, Hounslow, Royaume-Uni
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Ajouter au panierEtat : New. Print on Demand pp. 308.
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The Core Test Wrapper Handbook: Rationale and Application.
Vendeur : Biblios, Frankfurt am main, HESSE, Allemagne
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EUR 164,98
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Ajouter au panierEtat : New. PRINT ON DEMAND pp. 308.
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The Core Test Wrapper Handbook
Edité par Springer US, Springer US Okt 2014, 2014
ISBN 10 : 148998769X ISBN 13 : 9781489987693
Langue: anglais
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
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Ajouter au panierTaschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to become a tens-of-dollars embedded core. I ran into first hand the problem of trying to deliver what used to be a whole chip with something on the order of over 400 interconnect signals to a design team that was going to stuff it into a package with less than 220 signal pins and surround it with other logic. I also ran into the problem of delivering microprocessor specification verifi- tion ¿ a microprocessor is not just about the functions and instructions included with the instruction set, but also the MIPs rating at some given f- quency. I faced two dilemmas: one, I could not deliver functional vectors without significant development of off-core logic to deal with the reduced chip I/O map (and everybody's I/O map was going to be a little different); and two, the JTAG (1149. 1) boundary scan ring that was around my core when it was a chip was going to be woefully inadequate since it did not support - speed signal application and capture and independent use separate from my core. I considered the problem at length and came up with my own solution that was predominantly a separate non-JTAG scan test wrapper that supported at-speed application of launch-capture cycles using the system clock. But my problems weren't over at that point either.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 308 pp. Englisch.
