Vendeur : Lucky's Textbooks, Dallas, TX, Etats-Unis
EUR 156,79
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New.
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
EUR 158,31
Quantité disponible : 15 disponible(s)
Ajouter au panierEtat : New.
Vendeur : Lucky's Textbooks, Dallas, TX, Etats-Unis
EUR 157,13
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New.
Vendeur : California Books, Miami, FL, Etats-Unis
EUR 177,81
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New.
Vendeur : GreatBookPricesUK, Woodford Green, Royaume-Uni
EUR 171,36
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New.
EUR 187,79
Quantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. pp. 226.
Vendeur : California Books, Miami, FL, Etats-Unis
EUR 193,65
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New.
Vendeur : preigu, Osnabrück, Allemagne
EUR 141,30
Quantité disponible : 5 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. Functional Design Errors in Digital Circuits | Diagnosis Correction and Repair | Kai-Hui Chang (u. a.) | Taschenbuch | xxiv | Englisch | 2010 | Springer Netherland | EAN 9789048181124 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Vendeur : Buchpark, Trebbin, Allemagne
EUR 112,63
Quantité disponible : 1 disponible(s)
Ajouter au panierEtat : Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
Vendeur : Buchpark, Trebbin, Allemagne
EUR 112,63
Quantité disponible : 1 disponible(s)
Ajouter au panierEtat : Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
Langue: anglais
Edité par Springer Netherlands, Springer Netherlands, 2010
ISBN 10 : 9048181127 ISBN 13 : 9789048181124
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
EUR 162,91
Quantité disponible : 1 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
EUR 166,62
Quantité disponible : 2 disponible(s)
Ajouter au panierBuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Vendeur : GreatBookPricesUK, Woodford Green, Royaume-Uni
EUR 226,26
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : As New. Unread book in perfect condition.
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
EUR 216,84
Quantité disponible : 1 disponible(s)
Ajouter au panierHardcover. Etat : Like New. Like New. book.
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
EUR 248,87
Quantité disponible : 15 disponible(s)
Ajouter au panierEtat : As New. Unread book in perfect condition.
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
EUR 243,95
Quantité disponible : 1 disponible(s)
Ajouter au panierPaperback. Etat : Like New. Like New. book.
Langue: anglais
Edité par Springer Netherlands Okt 2010, 2010
ISBN 10 : 9048181127 ISBN 13 : 9789048181124
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
EUR 149,79
Quantité disponible : 2 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices. 224 pp. Englisch.
Langue: anglais
Edité par SPRINGER NATURE Dez 2008, 2008
ISBN 10 : 1402093640 ISBN 13 : 9781402093647
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
EUR 160,49
Quantité disponible : 2 disponible(s)
Ajouter au panierBuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices. 200 pp. Englisch.
Vendeur : moluna, Greven, Allemagne
EUR 136,16
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Coverage of novel techniques to automate IC debugging, a subject rarely covered in other booksComprehensive scope and solutions: from RTL to post-silicon debuggingThe innovative techniques covered in this book are recent and have been featu.
Vendeur : moluna, Greven, Allemagne
EUR 137,26
Quantité disponible : Plus de 20 disponibles
Ajouter au panierGebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Coverage of novel techniques to automate IC debugging, a subject rarely covered in other booksComprehensive scope and solutions: from RTL to post-silicon debuggingThe innovative techniques covered in this book are recent and have been featu.
Vendeur : Majestic Books, Hounslow, Royaume-Uni
EUR 201,39
Quantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. Print on Demand pp. 226 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
Vendeur : Biblios, Frankfurt am main, HESSE, Allemagne
EUR 204,01
Quantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. PRINT ON DEMAND pp. 226.
Langue: anglais
Edité par Springer Netherlands, Springer Netherlands Okt 2010, 2010
ISBN 10 : 9048181127 ISBN 13 : 9789048181124
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
EUR 160,49
Quantité disponible : 1 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 224 pp. Englisch.