Vendeur : Basi6 International, Irving, TX, Etats-Unis
EUR 86,43
Quantité disponible : 1 disponible(s)
Ajouter au panierEtat : Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Vendeur : Lucky's Textbooks, Dallas, TX, Etats-Unis
EUR 101,06
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New.
Vendeur : Lucky's Textbooks, Dallas, TX, Etats-Unis
EUR 101,06
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New.
Vendeur : Books Puddle, New York, NY, Etats-Unis
EUR 105,61
Quantité disponible : 1 disponible(s)
Ajouter au panierEtat : New. pp. 272.
Vendeur : Majestic Books, Hounslow, Royaume-Uni
EUR 104,91
Quantité disponible : 1 disponible(s)
Ajouter au panierEtat : New. pp. 272 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
EUR 111,70
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New. In.
Vendeur : Books Puddle, New York, NY, Etats-Unis
EUR 140,65
Quantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. pp. 272.
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
EUR 151,17
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New. In.
Langue: anglais
Edité par Springer Netherlands, Springer Netherlands, 2012
ISBN 10 : 9400730934 ISBN 13 : 9789400730939
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
EUR 109,94
Quantité disponible : 1 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
EUR 112,94
Quantité disponible : 2 disponible(s)
Ajouter au panierBuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
EUR 162,27
Quantité disponible : 1 disponible(s)
Ajouter au panierPaperback. Etat : Like New. Like New. book.
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
EUR 187,15
Quantité disponible : 1 disponible(s)
Ajouter au panierHardcover. Etat : Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Langue: anglais
Edité par Springer Netherlands Mrz 2012, 2012
ISBN 10 : 9400730934 ISBN 13 : 9789400730939
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
EUR 106,99
Quantité disponible : 2 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance. 272 pp. Englisch.
Langue: anglais
Edité par SPRINGER NATURE Dez 2009, 2009
ISBN 10 : 9048132819 ISBN 13 : 9789048132812
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
EUR 106,99
Quantité disponible : 2 disponible(s)
Ajouter au panierBuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance. 257 pp. Englisch.
Vendeur : moluna, Greven, Allemagne
EUR 92,27
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Introduction of model based hardware testingDescribes fault models for nanoscaled CMOS technologyFault simulation, ATPG and diagnosis algorithms for complex fault modelsComprehensive treatment including memory and low power aspects.
Vendeur : moluna, Greven, Allemagne
EUR 93
Quantité disponible : Plus de 20 disponibles
Ajouter au panierGebunden. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Introduction of model based hardware testingDescribes fault models for nanoscaled CMOS technologyFault simulation, ATPG and diagnosis algorithms for complex fault modelsComprehensive treatment including memory and low power aspects.
Vendeur : Biblios, Frankfurt am main, HESSE, Allemagne
EUR 134,66
Quantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. PRINT ON DEMAND pp. 272.
Vendeur : Majestic Books, Hounslow, Royaume-Uni
EUR 142,95
Quantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. Print on Demand pp. 272 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
Vendeur : Biblios, Frankfurt am main, HESSE, Allemagne
EUR 148,01
Quantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. PRINT ON DEMAND pp. 272.
Vendeur : preigu, Osnabrück, Allemagne
EUR 95,70
Quantité disponible : 5 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. Models in Hardware Testing | Lecture Notes of the Forum in Honor of Christian Landrault | Hans-Joachim Wunderlich | Taschenbuch | xiv | Englisch | 2012 | Springer Netherland | EAN 9789400730939 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
Langue: anglais
Edité par Springer Netherlands, Springer Netherlands Mär 2012, 2012
ISBN 10 : 9400730934 ISBN 13 : 9789400730939
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
EUR 106,99
Quantité disponible : 1 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 272 pp. Englisch.