Quantitative x ray diffractometry par zevin lev (14 résultats)

Dec 06, 1995. Etat : Used: Good. Quantitative X-Ray Diffractometry | Zevin - Kimmel | Springer Verlag New-York Berlin, 1995, in-8° cartonnage éditeur de 372 pages. Couverture propre. Dos solide. Intérieur frais sans soulignage ou annotation. Exemplaire de bibliothèque : petit code barre en pied de 1re de couv., cotation au dos,…

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its p…

Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be mea…

Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pat…

Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measure…