Single event effects space (34 résultats)

Paperback or Softback. Etat : New. Single Event Effects: Space and Atmospheric Environments. Book.

Etat : New.

Paperback or Softback. Etat : New. Test Guideline for Evaluating Low-Energy Proton-Induced Single-Event Effects in Space Systems. Book.

Etat : As New. Unread book in perfect condition.

Etat : New.

Etat : As New. Unread book in perfect condition.

Etat : New.

Etat : New.

Etat : As New. Unread book in perfect condition.

Etat : New.

Etat : As New. Unread book in perfect condition.

hardcover. Etat : Fine.

Etat : New.

Hardcover. Etat : new. Hardcover. This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described.Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA.Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologiesAddresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologiesReveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levelsOffers readers the first book in which particle accelerator applications will be extensively included in the radiation effects contextThis is an open access book. This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.…

Etat : New. 2025th edition NO-PA16APR2015-KAP.

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described.Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA.Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologiesAddresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologiesReveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levelsOffers readers the first book in which particle accelerator applications will be extensively included in the radiation effects contextThis is an open access book.…

Taschenbuch. Etat : Neu. Single-Event Effects, from Space to Accelerator Environments | Analysis, Prediction and Hardening by Design | Ygor Quadros de Aguiar (u. a.) | Taschenbuch | x | Englisch | 2025 | Springer | EAN 9783031717253 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Etat : New.

Hardcover. Etat : new. Hardcover. This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described.Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA.Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologiesAddresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologiesReveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levelsOffers readers the first book in which particle accelerator applications will be extensively included in the radiation effects contextThis is an open access book. This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.…

hardcover. Etat : New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Etat : New. Print on Demand pp. 24.

Etat : New. Print on Demand pp. 24.

Etat : New. PRINT ON DEMAND pp. 24.

Hardcover. Etat : New. Hardcover Pages Number: 354 Language: Chinese. VLSI single particle effects of the space electronic equipment protection technology space electronic equipment processing platform. the most commonly used on the SEE sensitive FP-GA and DSP as a research object for the increasingly urgent single-particle effect of the protection design problem. a whole new level from the device applications. failure analysis model of single-particle effects and failure characteristics in research on FPGA and DSP.…

Etat : new. Questo è un articolo print on demand.

Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described.Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA.Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologiesAddresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologiesReveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levelsOffers readers the first book in which particle accelerator applications will be extensively included in the radiation effects contextThis is an open access book. 141 pp. Englisch. …

Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described.Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA.Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologiesAddresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologiesReveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levelsOffers readers the first book in which particle accelerator applications will be extensively included in the radiation effects contextThis is an open access book. 141 pp. Englisch.…

Etat : New. Print on Demand.

Etat : New. PRINT ON DEMAND.

Buch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described.Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA.Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologiesAddresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologiesReveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levelsOffers readers the first book in which particle accelerator applications will be extensively included in the radiation effects contextThis is an open access book.…