Langue: anglais
Edité par VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2012
ISBN 10 : 3848409623 ISBN 13 : 9783848409624
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Ajouter au panierEtat : New. pp. 108.
Langue: anglais
Edité par LAP LAMBERT Academic Publishing, 2012
ISBN 10 : 3848409623 ISBN 13 : 9783848409624
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Ajouter au panierTaschenbuch. Etat : Neu. Techniques for Power and Reliability Optimization of CMOS Logic | Power optimization, soft error tolerance improvement | Abdulkadir Utku Diril | Taschenbuch | 108 S. | Englisch | 2012 | LAP LAMBERT Academic Publishing | EAN 9783848409624 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.
Langue: anglais
Edité par LAP LAMBERT Academic Publishing, 2012
ISBN 10 : 3848409623 ISBN 13 : 9783848409624
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Ajouter au panierPaperback. Etat : Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Langue: anglais
Edité par LAP LAMBERT Academic Publishing Feb 2012, 2012
ISBN 10 : 3848409623 ISBN 13 : 9783848409624
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
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Ajouter au panierTaschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -As the transistors became smaller in size and the systems became faster, issues like power consumption, signal integrity, soft error tolerance, and testing became serious challenges. There is an increasing demand to put CAD tools in the design flow to address these issues at every step of the design process. First part of this research investigates circuit level techniques to reduce power consumption in digital systems. In second part, improving soft error tolerance of digital systems is considered as a trade off problem between power and reliability and a power aware dynamic soft error tolerance control strategy is developed. The objective of this research is to provide CAD tools and circuit design techniques to optimize power consumption and to increase soft error tolerance of digital circuits. Multiple supply and threshold voltages are used to reduce power consumption. Variable supply and threshold voltages are used together with variable capacitances to develop a dynamic soft error tolerance control scheme. 108 pp. Englisch.
Langue: anglais
Edité par VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2012
ISBN 10 : 3848409623 ISBN 13 : 9783848409624
Vendeur : Majestic Books, Hounslow, Royaume-Uni
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Ajouter au panierEtat : New. Print on Demand pp. 108 2:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on Creme w/Gloss Lam.
Langue: anglais
Edité par LAP LAMBERT Academic Publishing, 2012
ISBN 10 : 3848409623 ISBN 13 : 9783848409624
Vendeur : moluna, Greven, Allemagne
EUR 41,05
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Ajouter au panierEtat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Diril Abdulkadir UtkuDr. Diril completed his Ph.D. in 2005 at Georgia Institute of Technology on the subject of low power design and reliability of CMOS circuits. After finishing his Ph.D., he worked at NVIDIA in the power optimizati.
Langue: anglais
Edité par VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2012
ISBN 10 : 3848409623 ISBN 13 : 9783848409624
Vendeur : Biblios, Frankfurt am main, HESSE, Allemagne
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Ajouter au panierEtat : New. PRINT ON DEMAND pp. 108.
Langue: anglais
Edité par LAP LAMBERT Academic Publishing, 2012
ISBN 10 : 3848409623 ISBN 13 : 9783848409624
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
EUR 49
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Ajouter au panierTaschenbuch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - As the transistors became smaller in size and the systems became faster, issues like power consumption, signal integrity, soft error tolerance, and testing became serious challenges. There is an increasing demand to put CAD tools in the design flow to address these issues at every step of the design process. First part of this research investigates circuit level techniques to reduce power consumption in digital systems. In second part, improving soft error tolerance of digital systems is considered as a trade off problem between power and reliability and a power aware dynamic soft error tolerance control strategy is developed. The objective of this research is to provide CAD tools and circuit design techniques to optimize power consumption and to increase soft error tolerance of digital circuits. Multiple supply and threshold voltages are used to reduce power consumption. Variable supply and threshold voltages are used together with variable capacitances to develop a dynamic soft error tolerance control scheme.
Langue: anglais
Edité par LAP LAMBERT Academic Publishing Feb 2012, 2012
ISBN 10 : 3848409623 ISBN 13 : 9783848409624
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
EUR 49
Quantité disponible : 1 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -As the transistors became smaller in size and the systems became faster, issues like power consumption, signal integrity, soft error tolerance, and testing became serious challenges. There is an increasing demand to put CAD tools in the design flow to address these issues at every step of the design process. First part of this research investigates circuit level techniques to reduce power consumption in digital systems. In second part, improving soft error tolerance of digital systems is considered as a trade off problem between power and reliability and a power aware dynamic soft error tolerance control strategy is developed. The objective of this research is to provide CAD tools and circuit design techniques to optimize power consumption and to increase soft error tolerance of digital circuits. Multiple supply and threshold voltages are used to reduce power consumption. Variable supply and threshold voltages are used together with variable capacitances to develop a dynamic soft error tolerance control scheme.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 108 pp. Englisch.