Testing semiconductor memories theory (11 résultats)

Etat : good. Book shows general signs of use and handling. May have light wear on the cover or edges and minimal writing or highlighting. Binding remains tight, and pages are clean and readable.

Etat : Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

Hardcover. Etat : Good. Good condition book without dust jacket. Boards are clean with light wear, fading to spine. Book has clean with slight age tone.

Hardcover. Etat : Very Good condition. Etat de la jaquette : No dust jacket, as issued. 1st ed? (No additional printings listed. Gouda, The Netherlands: A. J. van de Goor, 1998. Very Good condition. NO chips, tears or fading. We have only this 1 but it is available to ship TODAY from Henderson, Nevada. NO owner's name or bookplate. NOT a library discard. Pages are clean and unmarked. NO underlining. NO highlighting. NO margin notes. Bound in the original green laminated boards. "Goor (EE, Delft U.) presents memory test models on the chip, array, and board level. For each a class of fault models is introduced together with opposite tests. He particularly stresses the appropriateness of fault models to their class." -- Annotation copyright Book News, Inc. Portland, Or. GoodReads rating: 4.50 stars. From an AI overview: "Testing Semiconductor Memories: Theory and Practice is a comprehensive reference book written by A. J. van de Goor and published in 1991 [this edition 1998]. Book Overview: Author: A.J. van de Goor (Delft University of Technology). Length: 512 pages. Primary Focus: Testing and fault modeling of memory devices across chip, array, and board levels. Key Topics Covered: Memory Architectures: Recaps reliability theory and details static RAM (SRAM) and dynamic RAM (DRAM) cell structures and peripheral circuitry. Fault Models: Introduces major failure modes, including Stuck-at faults, Transition faults, Coupling faults, and Neighbourhood Pattern Sensitive faults (NPSFs).Test Algorithms: Provides functional testing algorithms alongside mathematical proofs for their correctness." NO software included with this 1998 edition. . 1st ed? (No additional printings listed. Hardcover. Very Good condition/No dust jacket, as issued. Illus. by NOT a library discard. 8vo. xxiv, 512pp. Great Packaging, Fast Shipping. NOT a library discard (illustrateur). …

Hardcover. Etat : Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority.

Hardcover. Etat : Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Hardcover. Etat : new. New Copy. Customer Service Guaranteed.

hardcover. Etat : New. In shrink wrap. Looks like an interesting title.

Hardcover. Etat : Near Fine. No Jacket. 1st Edition. hardback book in near fine condition,motorola-employee name at top of first blank page.

hardcover. Etat : Good. Good. Dust Jacket NOT present. CD WILL BE MISSING. . SHIPS FROM MULTIPLE LOCATIONS. book.

Hardcover. Etat : Very Good. Hardback in very good + condition.