Transmission electron microscopy diffraction (76 résultats)

Soft cover. Etat : Fair. 222 numbered pages; A thesis by Paul Vincent Guthrie, Jr.; hole-punched to put in notebook; bound at this time by 3 stainless steel pins; minor age tan to text; med age tan and numerous speck/ marks to edges of closed pages; medium wear to edges of cover; medium handgrime to cover; a number of minor marks to cover; 1/4 inch tear to back cover; ex-library; weighs 2.25 pounds; measures 10.8 by 8.5 by .8 inches; 091813; inventory control: SB.…

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Paperback. Etat : New. The structure-property relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures.Introduces fundamentals of crystallographyCovers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methodsDescribes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrastsDiscusses applications of HRTEM in materials researchExplains concepts used in XRD and TEM lab trainingBased on the author's course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics. It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering. …

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paperback. Etat : New. Language:Chinese.Paperback. Pub Date: 2024-06 Pages: 240 Publisher: Metallurgical Industry Press This book consists of 3 parts. The first part is an introduction to crystallography. including the periodicity of crystals and Bravais lattices. the symmetry. point groups and space groups of crystals. examples of reciprocal lattices and crystal structure characterization; the second part is the X-ray diffraction of materials. including the geometric principles of X-ray diffraction. the diffractio.…

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Taschenbuch. Etat : Neu. Transmission Electron Microscopy | Diffraction, Imaging, and Spectrometry | C. Barry Carter (u. a.) | Taschenbuch | xxxiii | Englisch | 2018 | Springer | EAN 9783319799889 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

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