Bernstein joseph b (52 résultats)

Etat : good. Fast Free Shipping â" Good condition. It may show normal signs of use, such as light writing, highlighting, or library markings, but all pages are intact and the book is fully readable. A solid, complete copy that's ready to enjoy.

Paperback. Etat : Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Paperback. Etat : Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.

Hardcover. Etat : VG. Etat de la jaquette : Good. small edge chips to the unclipped dj, clean copy.

Ephemera. Etat : Very Good with no dust jacket. Soundly stapled binding. Pages clean, tanned. Wrappers tanned with light edge wear, light handling wear, overall light shelf wear. Contents: Gernsback, When is abortion legal? Wilson, Female sexual crimes. Secor, Artificial male organ. Bernstein, Menstruation without pain. Mozes, Eugene B., Premature birth, part 2. Cauldwell, The mechanics of mongolism. Winfield, Kidney stones. Branson, If you are Rh negative. Questions and answers, book reviews, sexological news, so they say, scientific sex notes. Line drawings, photographs; 7.5" (19 cm) tall; 64 pages. …

Hardcover. Etat : Near Fine. Etat de la jaquette : Good. 1st Edition. Tan textured paper-covered boards, lettered in red. 4th ptg.: Sept. 1943. Minor rubbing to extremities, slight moisture mark along lower front cover fore-edge. Firm binding, unmarked interior. Illus. dust jacket G with chipped spine extremities, corners rubbed, modest surface marks and rubs, 1" closed tear and related crease along bottom front panel edge, now in mylar. 251 pp. Size: 8vo - over 7¾" - 9¾" tall. Col. Francis Arnoldy and Joseph Bernstein (illustrateur). Book.…

Etat : New.

Etat : As New. Unread book in perfect condition.

Paperback. Etat : New. Brand new book, sourced directly from publisher. Dispatch time is 7-8 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.

Etat : New.

paperback. Etat : New. In shrink wrap. Looks like an interesting title.

Soft cover. Etat : Very Good. 128 pages + 130 pages of 1930s period advertising. Philip S Bernstein "Religion In Russia" / Genevieve Parkhurst "German Women In Politics" / Bertrand Russell "Why Is Modern Youth Cynical?" / Owen Wister "Roosevelt And The 1912 Disaster" / Roark Bradford "Come Day. Go Day" (story) / Joseph Stagg Lawrence "The Futility Of Farm Relief" / Lee Foster Hartman "Master Builder" (story) / Katharine Fullerton Gerould "Our Substitute Live" / Myron M Stearns "Two Flights In The Fog" / Letitia Preston Randall "Rhapsody In Mauve" (story) / Brendan Lee "Fisherman's Luck" / John Langdon-Davies "Two Childhoods" / Louis L Dublin "Can We Extend The Life Span?" (U.P.).…

Etat : As New. Unread book in perfect condition.

Etat : New. pp. 144 1st Edition.

Etat : New.

Etat : New. pp. 144.

Etat : New. In English.

HRD. Etat : New. New Book. Shipped from UK. Established seller since 2000.

Paperback. Etat : Brand New. 1st edition. 126 pages. 9.25x6.25x0.50 inches. In Stock.

Etat : New.

Etat : new.

Etat : As New. Unread book in perfect condition.

Etat : New. Satisfaction Guaranteed or your money back.

Etat : New.

Etat : New.

Etat : New. In English.

Hardcover. Etat : New. Brand new book, sourced directly from publisher. Dispatch time is 3-4 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.

Etat : As New. Unread book in perfect condition.

Hardback. Etat : New. RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality and Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the 'physics of failure', combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditionsDetailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and moreNew multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.…

Hardcover. Etat : new. Hardcover. RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the physics of failure, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditionsDetailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and moreNew multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.…