EUR 28,82
Quantité disponible : 1 disponible(s)
Ajouter au panierHardcover. Etat : Fine. Etat de la jaquette : Very Good. Short tail tear.
EUR 32,72
Quantité disponible : Plus de 20 disponibles
Ajouter au panierHardcover. Etat : Very Good. Jumbo-sized. Very Good - Crisp, clean, unread book with some shelfwear/edgewear, may have a remainder mark - NICE.
EUR 35,82
Quantité disponible : 1 disponible(s)
Ajouter au panierhardcover. Etat : Good. Ex-library book with stickers and/or stamps throughout.
EUR 45,02
Quantité disponible : 1 disponible(s)
Ajouter au panierhardcover. Etat : Like New. First Paperback Edition. Publisher: Fondation Beyeler, 2011. FINE softcover in illustrated/pictorial French wraps, as issued. First Edition in English, First Printing. As new. Pristine.
EUR 52,11
Quantité disponible : 1 disponible(s)
Ajouter au panierHardcover. Etat : Good. some shelfwear/edgewear but still NICE! - may have remainder mark or previous owner's name Jumbo-sized.
Edité par München, Heimeran Verlag, 1975., 1975
Vendeur : Antiquariat Hans Hammerstein, München, Allemagne
EUR 9
Quantité disponible : 1 disponible(s)
Ajouter au panierorigi.Leinenband mit Schutzumschlag, 8°, ca.340 Seiten. Schutzumschlag mit Kratzer und Einriss, sonst gut.
Edité par München, Heimeran Verlag, 1975., 1975
Vendeur : Antiquariat Hans Hammerstein, München, Allemagne
EUR 12
Quantité disponible : 1 disponible(s)
Ajouter au panierorigi.Leinenband mit Schutzumschlag, 8°, ca.340 Seiten. neuwertig.
Edité par München, Heimeran Verlag, 1975., 1975
Vendeur : Antiquariat Hans Hammerstein, München, Allemagne
EUR 12
Quantité disponible : 1 disponible(s)
Ajouter au panierorigi.Leinenband mit Schutzumschlag, 8°, ca.340 Seiten. neuwertig.
Edité par München, Heimeran Verlag, 1975., 1975
ISBN 10 : 3776501510 ISBN 13 : 9783776501513
Vendeur : Antiquariat Hans Hammerstein, München, Allemagne
EUR 14
Quantité disponible : 1 disponible(s)
Ajouter au panierOriginal-Leinenband mit Schutzumschlag, 8°, 347 Seiten. Schutzumschlag verblasst sonst guter Zustand.
Vendeur : Goodwill of Silicon Valley, SAN JOSE, CA, Etats-Unis
EUR 96,52
Quantité disponible : 1 disponible(s)
Ajouter au panierEtat : good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
EUR 166,95
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New. In.
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
EUR 166,95
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New. In.
Vendeur : GreatBookPricesUK, Woodford Green, Royaume-Uni
EUR 166,93
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New.
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
EUR 183,43
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : As New. Unread book in perfect condition.
Vendeur : GreatBookPrices, Columbia, MD, Etats-Unis
EUR 184,08
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : New.
Vendeur : GreatBookPricesUK, Woodford Green, Royaume-Uni
EUR 184,44
Quantité disponible : Plus de 20 disponibles
Ajouter au panierEtat : As New. Unread book in perfect condition.
Langue: anglais
Edité par Springer-Verlag New York Inc., US, 2010
ISBN 10 : 1441965874 ISBN 13 : 9781441965875
Vendeur : Rarewaves.com USA, London, LONDO, Royaume-Uni
EUR 208,72
Quantité disponible : Plus de 20 disponibles
Ajouter au panierHardback. Etat : New. 2010 ed. Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ?ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a ?rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a ?aw. If such ?aws were the result only of dust one might reduce their numbers, but ?aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de?ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible.
Vendeur : preigu, Osnabrück, Allemagne
EUR 140,10
Quantité disponible : 5 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. Coupled Data Communication Techniques for High-Performance and Low-Power Computing | Ron Ho (u. a.) | Taschenbuch | Integrated Circuits and Systems | xvi | Englisch | 2012 | Springer | EAN 9781461426172 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Vendeur : Books Puddle, New York, NY, Etats-Unis
EUR 212,99
Quantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. pp. 224.
Vendeur : Books Puddle, New York, NY, Etats-Unis
EUR 214,68
Quantité disponible : 4 disponible(s)
Ajouter au panierEtat : New. pp. 224.
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
EUR 167,14
Quantité disponible : 1 disponible(s)
Ajouter au panierTaschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a aw. If such aws were the result only of dust one might reduce their numbers, but aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible.
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
EUR 168,73
Quantité disponible : 2 disponible(s)
Ajouter au panierBuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a aw. If such aws were the result only of dust one might reduce their numbers, but aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible.
Langue: anglais
Edité par Springer-Verlag New York Inc., 2012
ISBN 10 : 1461426170 ISBN 13 : 9781461426172
Vendeur : Revaluation Books, Exeter, Royaume-Uni
EUR 234,56
Quantité disponible : 2 disponible(s)
Ajouter au panierPaperback. Etat : Brand New. 222 pages. 9.20x6.10x0.51 inches. In Stock.
Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
EUR 230,12
Quantité disponible : 1 disponible(s)
Ajouter au panierPaperback. Etat : Like New. Like New. book.
Langue: anglais
Edité par Springer-Verlag New York Inc., US, 2010
ISBN 10 : 1441965874 ISBN 13 : 9781441965875
Vendeur : Rarewaves.com UK, London, Royaume-Uni
EUR 196,82
Quantité disponible : Plus de 20 disponibles
Ajouter au panierHardback. Etat : New. 2010 ed. Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ?ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a ?rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a ?aw. If such ?aws were the result only of dust one might reduce their numbers, but ?aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de?ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible.
EUR 1 779,34
Quantité disponible : 2 disponible(s)
Ajouter au panierHardcover. Etat : New.
Langue: allemand
Edité par Fondation Beyeler, Riehen, 2011
ISBN 10 : 390563290X ISBN 13 : 9783905632903
Vendeur : Antiquariat UEBUE, Zürich, Suisse
Edition originale
EUR 39,02
Quantité disponible : 2 disponible(s)
Ajouter au panierSoftcover. Etat : Sehr gut. 1. Auflage. M : 290 Seiten, 304 Abb. - Anhand von beispielhaft präsentierten Werken prominenter Vertreter des Surrealismus, neben Salvador Dalí, Max Ernst und Joan Miró auch René Magritte, Yves Tanguy oder Meret Oppenheim, werden charakteristische Wirkweisen und Strategien des Surrealismus erfahrbar. Nicht nur zeitgenössische Künstler finden darin Quellen der Inspiration und aktuelle Bezüge.
Langue: allemand
Edité par Hatje Cantz Verlag, 2011, 2011
ISBN 10 : 3775731601 ISBN 13 : 9783775731607
Vendeur : Antiquariat Hans Hammerstein, München, Allemagne
EUR 32
Quantité disponible : 1 disponible(s)
Ajouter au panierOriginal Leinenband mit Schutzumschlag, Gr.-4, 290 Seiten Guter Zustand.
Langue: allemand
Edité par München ; Wien : Hanser, 1983
ISBN 10 : 3446133283 ISBN 13 : 9783446133280
Vendeur : Antiquariat Udo Schwörer, Pforzheim, Allemagne
EUR 25
Quantité disponible : 1 disponible(s)
Ajouter au panierOrig.-Leder mit Folienumschlag. Etat : Gut. 463 S. 9783446133280 krankheitsbedingt erfolgt der Versand nur 1x pro Woche. Sprache: Deutsch Gewicht in Gramm: 550.
Vendeur : Basi6 International, Irving, TX, Etats-Unis
EUR 128,65
Quantité disponible : 10 disponible(s)
Ajouter au panierEtat : Brand New. New. US edition. Print on demand title. Delivery takes 20-25 days.