Mcgilp john (17 résultats)
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Vendeur : The Bookseller, Edmonton, AB, CanadaThe Bookseller
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EUR 14,71
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Hardcover. Etat : Good+. No Jacket. A little reading wear. Otherwsie a solid, unmarked volume.
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Vendeur : Chris Morris Books, Oxford, OXON, Royaume-UniChris Morris Books
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EUR 29,78
EUR 13,95 expéditionExpédition depuis Royaume-Uni vers Etats-UnisQuantité disponible : 1 disponible(s)
Hardcover. Etat : Very Good. An investigation into optical techniques for extracting surface and interface information with a resolution of less than a single atomic layer. These techniques have been widely applied to semiconductor surfaces and interfaces, and include polarised reflection techniques such as reflection anisotropy… spectroscopy and spectroscopic ellipsometry, Raman scattering, and optical second harmonic and sum frequency generation. Epitoptics' potential in the area of growth monitoring, and in situ monitoring of semiconductor growth with submonolayer sensitivity has been demonstrated in growth reactors under normal operating conditions. The book emphasizes studies of submonolayer growth on semiconductor surfaces. Chapters include: Spectroscopic Ellipsometry Reflection Difference Techniques Raman Spectroscopy Photoluminescence Spectroscopy On the Theory of Second Harmonic Generation Second Harmonic and Sum Frequency Generation Conclusions Hardback, pp230.
Autres imagesLangue : anglais
Edité par Luss Heritage Group, 2010
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- Édition originale
Vendeur : Hanselled Books, Burntisland, FIFE, Royaume-UniHanselled Books
Contacter le vendeurVendeur avec une évaluation de 5 étoilesMembre d’une association professionnelle : IOBA
Etat: Occasion - Assez bon
EUR 39,68
EUR 19,84 expéditionExpédition depuis Royaume-Uni vers Etats-UnisQuantité disponible : 1 disponible(s)
Ajouter au panierSoft cover. Etat : Very Good. No Jacket. 1st Edition. P/B 110 pages condition is Very good.
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Vendeur : Ria Christie Collections, Uxbridge, Royaume-UniRia Christie Collections
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 61,07
EUR 13,98 expéditionExpédition depuis Royaume-Uni vers Etats-UnisQuantité disponible : Plus de 20 disponibles
Etat : New. In.
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Vendeur : Chiron Media, Wallingford, Royaume-UniChiron Media
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EUR 57,43
EUR 18,08 expéditionExpédition depuis Royaume-Uni vers Etats-UnisQuantité disponible : 10 disponible(s)
Paperback. Etat : New.
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Vendeur : Books Puddle, New York, NY, Etats-UnisBooks Puddle
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EUR 77,27
EUR 3,41 expéditionExpédition nationale : Etats-UnisQuantité disponible : 4 disponible(s)
Etat : New. pp. 248.
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Vendeur : Revaluation Books, Exeter, Royaume-UniRevaluation Books
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EUR 77,42
EUR 11,67 expéditionExpédition depuis Royaume-Uni vers Etats-UnisQuantité disponible : 2 disponible(s)
Paperback. Etat : Brand New. reprint edition. 242 pages. 9.25x6.10x0.80 inches. In Stock.
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Vendeur : AHA-BUCH GmbH, Einbeck, AllemagneAHA-BUCH GmbH
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 53,49
EUR 61,91 expéditionExpédition depuis Allemagne vers Etats-UnisQuantité disponible : 1 disponible(s)
Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - The study of condensed matter using optical techniques, where photons act as both probe and signal, has a long history. It is only recently, however, that the extraction of surface and interface information, with submonolayer resolution, has been shown… to be possible using optical techniques (where 'optical' applies to electromagnetic radiation in and around the visible region of the spectrum). This book describes these 'epioptic' techniques, which have now been quite widely applied to semiconductor surfaces and interfaces. Particular emphasis in the book is placed on recent studies of submonolayer growth on well-characterised semiconductor surfaces, many of which have arisen from CEC DGJGII ESPRIT Basic Research Action No. 3177 'EPIOPTIC', and CEU DGIII ESPRIT Basic Research Action No. 6878 'EASI'. Techniques using other areas of the spectrum such as the infra-red region (IR spectroscopy, in its various surface configurations), and the x-ray region (surface x-ray diffraction, x-ray standing wave), are omitted. The optical techniques described use simple lamp or small laser sources and are thus, in principle, easily accessible. Epioptic probes can provide new information on solid-gas, solid-liquid and liquid-liquid interfaces. They are particularly suited to growth monitoring. Emerging process technologies for fabricating submicron and nanoscale semiconductor devices and novel multilayer materials, whether based on silicon or compound semiconductors, all require extremely precise control of growth at surfaces. In situ, non-destructive, real-time monitoring and characterisation of surfaces under growth conditions is needed for further progress. Both atomic scale resolution, and non-destructive characterisation of buried structures, are required.
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Vendeur : preigu, Osnabrück, Allemagnepreigu
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EUR 50,40
EUR 70,00 expéditionExpédition depuis Allemagne vers Etats-UnisQuantité disponible : 5 disponible(s)
Taschenbuch. Etat : Neu. Epioptics | Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces | John F. McGilp (u. a.) | Taschenbuch | ESPRIT Basic Research Series | xii | Englisch | 2011 | Springer | EAN 9783642798221 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, jue…rgen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Vendeur : Mispah books, Redhill, SURRE, Royaume-UniMispah books
Contacter le vendeurVendeur avec une évaluation de 4 étoilesEtat: Occasion - Comme neuf
EUR 108,21
EUR 29,18 expéditionExpédition depuis Royaume-Uni vers Etats-UnisQuantité disponible : 1 disponible(s)
Paperback. Etat : Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Vendeur : Buchpark, Trebbin, AllemagneBuchpark
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EUR 61,36
EUR 105,00 expéditionExpédition depuis Allemagne vers Etats-UnisQuantité disponible : 1 disponible(s)
Etat : Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
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Vendeur : Brook Bookstore On Demand, Napoli, NA, ItalieBrook Bookstore On Demand
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EUR 46,22
EUR 5,50 expéditionExpédition depuis Italie vers Etats-UnisQuantité disponible : Plus de 20 disponibles
Etat : new. Questo è un articolo print on demand.
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Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, AllemagneBuchWeltWeit Ludwig Meier e.K.
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EUR 53,49
EUR 23,00 expéditionExpédition depuis Allemagne vers Etats-UnisQuantité disponible : 2 disponible(s)
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The study of condensed matter using optical techniques, where photons act as both probe and signal, has a long history. It is only recently, however, that the extraction of surface and interface information, with submonolayer resolution…, has been shown to be possible using optical techniques (where 'optical' applies to electromagnetic radiation in and around the visible region of the spectrum). This book describes these 'epioptic' techniques, which have now been quite widely applied to semiconductor surfaces and interfaces. Particular emphasis in the book is placed on recent studies of submonolayer growth on well-characterised semiconductor surfaces, many of which have arisen from CEC DGJGII ESPRIT Basic Research Action No. 3177 'EPIOPTIC', and CEU DGIII ESPRIT Basic Research Action No. 6878 'EASI'. Techniques using other areas of the spectrum such as the infra-red region (IR spectroscopy, in its various surface configurations), and the x-ray region (surface x-ray diffraction, x-ray standing wave), are omitted. The optical techniques described use simple lamp or small laser sources and are thus, in principle, easily accessible. Epioptic probes can provide new information on solid-gas, solid-liquid and liquid-liquid interfaces. They are particularly suited to growth monitoring. Emerging process technologies for fabricating submicron and nanoscale semiconductor devices and novel multilayer materials, whether based on silicon or compound semiconductors, all require extremely precise control of growth at surfaces. In situ, non-destructive, real-time monitoring and characterisation of surfaces under growth conditions is needed for further progress. Both atomic scale resolution, and non-destructive characterisation of buried structures, are required. 248 pp. Englisch.
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Vendeur : Majestic Books, Hounslow, Royaume-UniMajestic Books
Contacter le vendeurVendeur avec une évaluation de 4 étoilesEtat: Neuf
EUR 76,83
EUR 7,59 expéditionExpédition depuis Royaume-Uni vers Etats-UnisQuantité disponible : 4 disponible(s)
Etat : New. Print on Demand pp. 248 120 Figures, 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
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Vendeur : Biblios, frankfurt am main, HESSE, AllemagneBiblios
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EUR 79,66
EUR 9,95 expéditionExpédition depuis Allemagne vers Etats-UnisQuantité disponible : 4 disponible(s)
Etat : New. PRINT ON DEMAND pp. 248.
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Vendeur : moluna, Greven, Allemagnemoluna
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EUR 48,37
EUR 48,99 expéditionExpédition depuis Allemagne vers Etats-UnisQuantité disponible : Plus de 20 disponibles
Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The study of condensed matter using optical techniques, where photons act as both probe and signal, has a long history. It is only recently, however, that the extraction of surface and interface information, with submonol…ayer resolution, has been shown to b.
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Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagnebuchversandmimpf2000
Contacter le vendeurVendeur avec une évaluation de 5 étoilesEtat: Neuf
EUR 53,49
EUR 60,00 expéditionExpédition depuis Allemagne vers Etats-UnisQuantité disponible : 1 disponible(s)
Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -The study of condensed matter using optical techniques, where photons act as both probe and signal, has a long history. It is only recently, however, that the extraction of surface and interface information, with submonolayer resolution, ha…s been shown to be possible using optical techniques (where 'optical' applies to electromagnetic radiation in and around the visible region of the spectrum). This book describes these 'epioptic' techniques, which have now been quite widely applied to semiconductor surfaces and interfaces. Particular emphasis in the book is placed on recent studies of submonolayer growth on well-characterised semiconductor surfaces, many of which have arisen from CEC DGJGII ESPRIT Basic Research Action No. 3177 'EPIOPTIC', and CEU DGIII ESPRIT Basic Research Action No. 6878 'EASI'. Techniques using other areas of the spectrum such as the infra-red region (IR spectroscopy, in its various surface configurations), and the x-ray region (surface x-ray diffraction, x-ray standing wave), are omitted. The optical techniques described use simple lamp or small laser sources and are thus, in principle, easily accessible. Epioptic probes can provide new information on solid-gas, solid-liquid and liquid-liquid interfaces. They are particularly suited to growth monitoring. Emerging process technologies for fabricating submicron and nanoscale semiconductor devices and novel multilayer materials, whether based on silicon or compound semiconductors, all require extremely precise control of growth at surfaces. In situ, non-destructive, real-time monitoring and characterisation of surfaces under growth conditions is needed for further progress. Both atomic scale resolution, and non-destructive characterisation of buried structures, are required.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 248 pp. Englisch.
