Rajeevan chandel (79 résultats)

xiii, 113p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. Bumped.Little flexed. Sprache: Englisch. …

hardcover. Etat : Very Good.

Etat : Good. Has some wear and creases. Has a remainder mark. hardcover Used - Good 2019.

Hardcover. Etat : Near Fine. Book has light wear to the edges and corners, otherwise in near new condition.

paperback. Etat : Very Good.

Etat : New.

Softcover. Etat : Wie neu. 1. Auflage. As good as new, unread book in perfect condition. Language - English. Ships from Berlin.

Hardcover. Etat : New. Brand new book, sourced directly from publisher. Dispatch time is 24-48 hours from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.

Etat : As New. Unread book in perfect condition.

hardcover. Etat : Fine.

Etat : New.

Etat : New.

hardcover. Etat : New.

Etat : Very Good. Good shape with typical wear. Has a remainder mark. hardcover Used - Very Good 2019.

Etat : New. In English.

Etat : As New. Unread book in perfect condition.

Etat : As New. Unread book in perfect condition.

Hardback. Etat : New. The book provides a detailed analysis of issues related to sub-threshold interconnect performance from the perspective of analytical approach and design techniques. Particular emphasis is laid on the performance analysis of coupling noise and variability issues in sub-threshold domain to develop efficient compact models. The proposed analytical approach gives physical insight of the parameters affecting the transient behavior of coupled interconnects. Remedial design techniques are also suggested to mitigate the effect of coupling noise. The effects of wire width, spacing between the wires, wire length are thoroughly investigated. In addition, the effect of parameters like driver strength on peak coupling noise has also been analyzed. Process, voltage and temperature variations are prominent factors affecting sub-threshold design and have also been investigated. The process variability analysis has been carried out using parametric analysis, process corner analysis and Monte Carlo technique. The book also provides a qualitative summary of the work reported in the literature by various researchers in the design of digital sub-threshold circuits. This book should be of interest for researchers and graduate students with deeper insights into sub-threshold interconnect models in particular. In this sense, this book will best fit as a text book and/or a reference book for students who are initiated in the area of research and advanced courses in nanotechnology, interconnect design and modeling.…

Etat : New.

Hardback. Etat : New. VLSI, or Very-Large-Scale-Integration, is the practice of combining billions of transistors to create an integrated circuit. At present, VLSI circuits are realised using CMOS technology. However, the demand for ever smaller, more efficient circuits is now pushing the limits of CMOS. Post-CMOS refers to the possible future digital logic technologies beyond the CMOS scaling limits. This 2-volume set addresses the current state of the art in VLSI technologies and presents potential options for post-CMOS processes. VLSI and Post-CMOS Electronics is a useful reference guide for researchers, engineers and advanced students working in the area of design and modelling of VLSI and post-CMOS devices and their circuits. Volume 1 focuses on design, modelling and simulation, including applications in low voltage and low power VLSI, and post-CMOS devices and circuits. Volume 2 addresses a wide range of devices, circuits and interconnects.…

Etat : New.

Hardback. Etat : New. VLSI, or Very-Large-Scale-Integration, is the practice of combining billions of transistors to create an integrated circuit. At present, VLSI circuits are realised using CMOS technology. However, the demand for ever smaller, more efficient circuits is now pushing the limits of CMOS. Post-CMOS refers to the possible future digital logic technologies beyond the CMOS scaling limits. This 2-volume set addresses the current state of the art in VLSI technologies and presents potential options for post-CMOS processes. VLSI and Post-CMOS Electronics is a useful reference guide for researchers, engineers and advanced students working in the area of design and modelling of VLSI and post-CMOS devices and their circuits. Volume 1 focuses on design, modelling and simulation, including applications in low voltage and low power VLSI, and post-CMOS devices and circuits. Volume 2 addresses a wide range of devices, circuits and interconnects.…

Etat : As New. Unread book in perfect condition.

Etat : New. In English.

Etat : As New. Unread book in perfect condition.

Etat : New.

Etat : New.

Etat : New.

Etat : New. pp. 128 Softcover reprint of the original 1st ed. 2015 edition NO-PA16APR2015-KAP.

Etat : New.