Singhee (54 résultats)

Etat : New. pp. 208.

Etat : New. pp. 208.

Etat : New. pp. 208.

PAP. Etat : New. New Book. Shipped from UK. Established seller since 2000.

PAP. Etat : New. New Book. Shipped from UK. Established seller since 2000.

Paperback. Etat : New. New copy - Usually dispatched within 4 working days.

Taschenbuch. Etat : Neu. Neuware - 'Something smells fishy here and I don't mean Mr H's uneaten dinner.'Meet Pojo Pande, aspiring private eye prowling the corridors of Heathcote International with a ready ear for eavesdropping and a nose for intrigue. And he's got two sidekicks-Radha Rao, a senior and the latest in a long line of Raos to skirt the school rules and Pops, a pesky junior who insists on being Pojo's protégé. Together, they face the toughest case of their career yet-the killing of Mr Heathcote, the beloved school cat. Join Pojo on his adventures in this hugely funny, unputdownable book as he gets to the bottom of the killing of Mr Heathcote.…

Etat : New. &Uumlber den AutorThe author of this work would love to set up an NGO to err . . . Save The Words. To donate, you need to adopt a word and promise to cherish it. The NGO will be called Grunt. Other than this the author would like to sta.

paperback. Etat : Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority.

Etat : very_good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in very good condition! The cover and any other included accessories are also in very good condition showing some minor use. The spine is straight, there are no rips tears or creases on the cover or the pages.…

Etat : As New. Unread book in perfect condition.

Etat : New.

Etat : New. In English.

Etat : New.

Etat : New. pp. 212.

Etat : New. pp. 212.

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime.…

Paperback. Etat : Brand New. 2009 edition. 210 pages. 9.25x6.10x0.48 inches. In Stock.

Taschenbuch. Etat : Neu. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits | Amith Singhee (u. a.) | Taschenbuch | xv | Englisch | 2012 | Springer | EAN 9789400736870 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Etat : New.

Etat : New.

Etat : Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher | Extreme Statistics in Nanoscale Memory Design brings together some of the world's leading experts in statistical EDA, memory design, device variability modeling and reliability modeling, to compile theoretical and practical results in one complete reference on statistical techniques for extreme statistics in nanoscale memories.The work covers a variety of techniques, including statistical, deterministic, model-based and non-parametric methods, along with relevant description of the sources of variations and their impact on devices and memory design. Specifically, the authors cover methods from extreme value theory, Monte Carlo simulation, reliability modeling, direct memory margin computation and hypervolume computation. Ideas are also presented both from the perspective of an EDA practitioner and a memory designer to provide a comprehensive understanding of the state-of -the-art in the area of extreme statistics estimation and statistical memory design.Extreme Statistics in Nanoscale Memory Design is a useful reference on statistical design of integrated circuits for researchers, engineers and professionals.…

Etat : As New. Unread book in perfect condition.

Etat : New. In English.

Etat : New. In English.

Etat : New. In English.

Taschenbuch. Etat : Neu. Extreme Statistics in Nanoscale Memory Design | Amith Singhee (u. a.) | Taschenbuch | Integrated Circuits and Systems | x | Englisch | 2012 | Springer | EAN 9781461426721 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Knowledge exists: you only have to nd it VLSI design has come to an important in ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri ce too much in terms of power consumption or manufacturing cost, to the extent of making the design goals even infeasible. We absolutely need to explicitly account for the statistics of this random variability, to have design margins that are accurate so that we can nd the optimum balance between yield loss and design cost. This discontinuity in design processes has led many researchers to develop effective methods of statistical design, where the designer can simulate not just the behavior of the nominal design, but the expected statistics of the behavior in manufactured ICs. Memory circuits tend to be the hardest hit by the problem of these random variations because of their high replication count on any single chip, which demands a very high statistical quality from the product. Requirements of 5-6s (0.…

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Knowledge exists: you only have to nd it VLSI design has come to an important in ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri ce too much in terms of power consumption or manufacturing cost, to the extent of making the design goals even infeasible. We absolutely need to explicitly account for the statistics of this random variability, to have design margins that are accurate so that we can nd the optimum balance between yield loss and design cost. This discontinuity in design processes has led many researchers to develop effective methods of statistical design, where the designer can simulate not just the behavior of the nominal design, but the expected statistics of the behavior in manufactured ICs. Memory circuits tend to be the hardest hit by the problem of these random variations because of their high replication count on any single chip, which demands a very high statistical quality from the product. Requirements of 5-6s (0.…

Etat : New. pp. 258.