Effects radiation electronic systems (55 résultats)

Hardcover. Etat : Very Good. Etat de la jaquette : Good. Condition: Book: slight shelf wear dust jacket: minor edgewear "Olesen's work on radiation effects on electronic systems is a comprehensive resource for understanding the impact of radiation on electronic devices. It is a valuable addition to the field of radiation effects and electronic systems, providing insights into the mechanisms and implications of radiation exposure on electronic components. ".…

Hardcover. Etat : UsedGood. Hardcover; surplus library copy with the usual stampings; reference number taped to spine; fading, light soiling, and shelf wear to exterior; corners bumped; fading to pages, with spotting to page edges; otherwise in good con dition with clean text, firm binding.

Etat : As New. Unread book in perfect condition.

Etat : New.

Etat : New.

hardcover. Etat : Very Good.

Etat : New. pp. 252.

Paperback. Etat : Brand New. 249 pages. 9.10x6.00x0.30 inches. In Stock.

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering.

Etat : New.

Etat : New.

Etat : New.

Etat : New.

Paperback. Etat : New. Softcover reprint of the original 1st ed. 1986.

Etat : New.

HARD BACK BLUE. DLV written in green marker to all page foredges DATE PUBLISHED: 1986 EDITION: 587 VERY GOOD. JACKET: VERY GOOD DJ.

Etat : As New. Unread book in perfect condition.

Hardcover. Etat : Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Hardback. Etat : New. This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation.  Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithmsCovers both terrestrial and avionic-level conditionsLogically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summaryWritten by a widely-recognized authority in soft-errors in electronic devicesCode samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods. …

Etat : New.

Etat : As New. Unread book in perfect condition.

Etat : New. Eishi, H. Ibe, Chief Researcher, Yokohama Research Laboratory, Hitachi, Ltd.Dr.Eishi Hidefumi IBE received his Ph.D degree in Nuclear Engineering from Osaka University, Japan in 1985. His expertise covers a wide area of science, such as elementary particle/.

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering.

Hardback. Etat : New. This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation.  Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithmsCovers both terrestrial and avionic-level conditionsLogically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summaryWritten by a widely-recognized authority in soft-errors in electronic devicesCode samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods. …

hardcover. Etat : New. In shrink wrap. Looks like an interesting title.

Hardcover. Etat : Brand New. 268 pages. 9.50x6.75x1.00 inches. In Stock.

Etat : New. pp. 608.

Hardback. Etat : New. This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation.  Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithmsCovers both terrestrial and avionic-level conditionsLogically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summaryWritten by a widely-recognized authority in soft-errors in electronic devicesCode samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods. …

Hardcover. Etat : new. Hardcover. This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithmsCovers both terrestrial and avionic-level conditionsLogically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summaryWritten by a widely-recognized authority in soft-errors in electronic devicesCode samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods. This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. …

Paperback. Etat : Brand New. reprint edition. 608 pages. 9.02x5.98x1.37 inches. In Stock.