Semiconductor material device characterization par schroder (35 résultats)

Hardcover. Etat : Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Hardcover. Etat : Very Good. No Jacket. Missing dust jacket; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Hardcover. Etat : Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.

Etat : Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

Hardcover. Etat : Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

Etat : good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.

Hardcover. Etat : Near Fine. Near Fine. First Edition; First Printing. A handsome first edition/first printing in Near Fine condition with previous owner's signature to front flyleaf in alike dust-jacket with light edgewear. [i-iv] v-vii [viii] ix-xv [xvi-xviii], 1-599 [600-6] pages; Book is written for graduate students and industrial researchers who want to learn more about the wide spectrum of measurement methods found in the modern semiconductor industry; 8vo.…

Etat : Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

Hardcover. Etat : Very Fine. Second Edition. No markings.

Hardcover. Etat : Near Fine. Etat de la jaquette : Near Fine. hardback book and dust jacket in near fine condition.

Hardcover. Etat : Fine.

Hardcover. Etat : New.

Hardcover. Etat : Very Good. 3. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.

Hardcover. Etat : Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Etat : Gut. Zustand: Gut | Seiten: 600 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.

HRD. Etat : New. New Book. Shipped from UK. Established seller since 2000.

Etat : new.

Etat : New.

Etat : New.

Etat : As New. Unread book in perfect condition.

Etat : As New. Unread book in perfect condition.

Hardcover. Etat : gut. 1990. Semiconductor Material and Device Characterization In englischer Sprache. pages.

Hardcover. Etat : New. Brand new book, sourced directly from publisher. Dispatch time is 3-4 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.

Etat : New. pp. 800 Illus.

Etat : New. This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Num Pages: 800 pages, illustrations. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 238 x 164 x 42. Weight in Grams: 1199. . 2006. 3rd Edition. Hardcover. . . . .…

Etat : New. In English.

Etat : New. BRAND NEW. book.

Etat : New. pp. 800 Index 3rd Edition.

Etat : New. DIETER K. SCHRODER, PhD, is Professor, Department of Electrical Engineering, Arizona State University. He is a recipient of the ASU College of Engineering Teaching Excellence Award and several other teaching awards. In addition to Semiconductor Material and.

Etat : New. This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Num Pages: 800 pages, illustrations. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 238 x 164 x 42. Weight in Grams: 1199. . 2006. 3rd Edition. Hardcover. . . . . Books ship from the US and Ireland.…