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Ajouter au panierPaperback. Etat : Very Good. Ex-library paperback in very nice condition with the usual markings and attachments. Except for library markings, interior clean and unmarked. Tight binding.
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Langue: anglais
Edité par Springer-Verlag Berlin and Heidelberg GmbH and Co. KG, DE, 2002
ISBN 10 : 354044016X ISBN 13 : 9783540440161
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Ajouter au panierPaperback. Etat : New. 2002 ed. With their introduction in 1995, Support Vector Machines (SVMs) marked the beginningofanewerainthelearningfromexamplesparadigm.Rootedinthe Statistical Learning Theory developed by Vladimir Vapnik at ATandT, SVMs quickly gained attention from the pattern recognition community due to a n- beroftheoreticalandcomputationalmerits.Theseinclude,forexample,the simple geometrical interpretation of the margin, uniqueness of the solution, s- tistical robustness of the loss function, modularity of the kernel function, and over?t control through the choice of a single regularization parameter. Like all really good and far reaching ideas, SVMs raised a number of - terestingproblemsforboththeoreticiansandpractitioners.Newappr oachesto Statistical Learning Theory are under development and new and more e?cient methods for computing SVM with a large number of examples are being studied. Being interested in the development of trainable systems ourselves, we decided to organize an international workshop as a satellite event of the 16th Inter- tional Conference on Pattern Recognition emphasizing the practical impact and relevance of SVMs for pattern recognition.By March 2002, a total of 57 full papers had been submitted from 21 co- tries.Toensurethehighqualityofworkshopandproceedings,theprogramc- mitteeselectedandaccepted30ofthemafterathoroughreviewprocess.Ofthese papers16werepresentedin4oralsessionsand14inapostersession.Thepapers span a variety of topics in pattern recognition with SVMs from computational theoriestotheirimplementations.Inadditiontotheseexcellentpresentations, there were two invited papers by Sayan Mukherjee, MIT and Yoshua Bengio, University of Montreal.
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Ajouter au panierHardcover. Etat : Fine. No Jacket. 1st Edition. 2006.Hardcover.Fine.343 pages.Ships from Japan.Usually ships in 1-2 working days.
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Ajouter au panierEtat : Used. pp. xiv + 343 1st Edition.
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Ajouter au panierTaschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - With their introduction in 1995, Support Vector Machines (SVMs) marked the beginningofanewerainthelearningfromexamplesparadigm.Rootedinthe Statistical Learning Theory developed by Vladimir Vapnik at AT&T, SVMs quickly gained attention from the pattern recognition community due to a n- beroftheoreticalandcomputationalmerits.Theseinclude,forexample,the simple geometrical interpretation of the margin, uniqueness of the solution, s- tistical robustness of the loss function, modularity of the kernel function, and over t control through the choice of a single regularization parameter. Like all really good and far reaching ideas, SVMs raised a number of - terestingproblemsforboththeoreticiansandpractitioners.Newapproachesto Statistical Learning Theory are under development and new and more e cient methods for computing SVM with a large number of examples are being studied. Being interested in the development of trainable systems ourselves, we decided to organize an international workshop as a satellite event of the 16th Inter- tional Conference on Pattern Recognition emphasizing the practical impact and relevance of SVMs for pattern recognition. By March 2002, a total of 57 full papers had been submitted from 21 co- tries.Toensurethehighqualityofworkshopandproceedings,theprogramc- mitteeselectedandaccepted30ofthemafterathoroughreviewprocess.Ofthese papers16werepresentedin4oralsessionsand14inapostersession.Thepapers span a variety of topics in pattern recognition with SVMs from computational theoriestotheirimplementations.Inadditiontotheseexcellentpresentations, there were two invited papers by Sayan Mukherjee, MIT and Yoshua Bengio, University of Montreal.
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Ajouter au panierTaschenbuch. Etat : Neu. Pattern Recognition with Support Vector Machines | First International Workshop, SVM 2002, Niagara Falls, Canada, August 10, 2002. Proceedings | Seong-Whan Lee (u. a.) | Taschenbuch | xii | Englisch | 2002 | Springer | EAN 9783540440161 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Ajouter au panierHardcover. Etat : New. In shrink wrap. Looks like an interesting title!
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Langue: anglais
Edité par Springer London Ltd, GB, 2010
ISBN 10 : 1849960976 ISBN 13 : 9781849960977
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Ajouter au panierHardback. Etat : New. 2nd ed. 2010.
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Ajouter au panierTaschenbuch. Etat : Neu. Support Vector Machines for Pattern Classification | Shigeo Abe | Taschenbuch | Advances in Computer Vision and Pattern Recognition | xx | Englisch | 2012 | Springer | EAN 9781447125488 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Ajouter au panierEtat : New. pp. 492 2nd Edition.