Transmission electron microscopy characterization (61 résultats)

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Taschenbuch. Etat : Neu. Microscopic Characterization Techniques | Scanning Electron Microscopy and Transmission Electron Microscopy | Ajeet Appasaheb Yelwande (u. a.) | Taschenbuch | Englisch | 2020 | LAP LAMBERT Academic Publishing | EAN 9786202797610 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.…

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Hardcover. Etat : gut. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. In englischer Sprache. 758 pages. 3,3 x 16 x 23,3 cm Auflage: 3rd ed. 2008. Corr. 2nd printing 2009.…

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Taschenbuch. Etat : Neu. Neuware - Handbook of Transmission Electron Microscopy is a practical and detailed guide to the principles, instruments, methods, and applications of modern TEM. It is written for students, researchers, laboratory scientists, materials engineers, and microscopy professionals who need a clear reference for study, experiment planning, data analysis, and technical reporting. The book begins with electron-specimen interactions, electron optics, microscope architecture, resolution, alignment, and calibration. It then explains specimen preparation for metals, ceramics, semiconductors, powders, thin films, interfaces, polymers, and site-specific FIB samples. Readers will learn how images and diffraction patterns are formed and how to choose suitable methods for a given materials problem. The chapters cover bright-field and dark-field imaging, diffraction contrast, phase contrast, HRTEM, STEM, HAADF imaging, SAED, CBED, nano-beam diffraction, precession electron diffraction, and 4D-STEM. The analytical electron microscopy sections provide clear guidance on: - Energy-dispersive X-ray spectroscopy, including EDS spectra, elemental mapping, peak identification, quantification, and uncertainty- Electron energy-loss spectroscopy, including EELS calibration, low-loss analysis, core-loss edges, ELNES, EFTEM, thickness measurement, and chemical-state interpretation- Electron tomography and three-dimensional reconstruction- Cryo-TEM and low-dose imaging for beam-sensitive materials- In situ and operando TEM for heating, cooling, electrical biasing, mechanical testing, gas-cell work, and liquid-cell studies- Quantitative image analysis, calibration, measurement uncertainty, data integrity, and reproducible workflows>This TEM textbook for materials science also supports work in nanomaterials characterization, microstructure analysis, crystallography, defect analysis, semiconductor research, metallurgy, catalysts, batteries, coatings, and advanced manufacturing materials. The final chapters bring the methods together into complete investigation workflows. They show how to select the right technique, control artefacts, check data quality, interpret results carefully, and prepare professional laboratory reports. Handbook of Transmission Electron Microscopy is suitable for university courses, postgraduate study, laboratory training, independent research, and day-to-day use as a TEM laboratory reference.…

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Etat : Used. pp. ix + 717 138 Illus.

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Etat : Sehr gut. Zustand: Sehr gut | Seiten: 728 | Sprache: Englisch | Produktart: Bücher | Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.…

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