Semiconductor device reliability (45 résultats)

paperback. Etat : New. Language:Chinese.Paperback. Pub Date: 2024-03 Pages: 168 Publisher: China Machinery Press This book is divided into 4 chapters. including an overview of semiconductor device defects and failure analysis technology. failure analysis technology of silicon integrated circuits (li). defects and failure analysis technology of power devices. and defects and failure analysis technology of compound semiconductor light-emitting devices. The author has opened columns in various places in the book to in.…

Etat : Good.

Etat : New. A brand new book in pristine condition. Showing zero signs of shelf wear, creases, or damage.

Hardcover. Etat : new. Hardcover. This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device. This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.…

Taschenbuch. Etat : Neu. Thermal Reliability of Power Semiconductor Device in the Renewable Energy System | Xiong Du (u. a.) | Taschenbuch | CPSS Power Electronics Series | xvi | Englisch | 2023 | Springer | EAN 9789811931345 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device. …

Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device. …

Etat : New.

Hardcover. Etat : New. In shrink wrap. Looks like an interesting title.

paperback. Etat : New. Semiconductor device reliability album 41681.

Hardcover. Etat : Brand New. 188 pages. 9.25x6.10x0.63 inches. In Stock.

Hardcover. Etat : New. Brand new book, sourced directly from publisher. Dispatch time is 3-4 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.

Hardcover. Etat : gut. 2022. Thermal Reliability of Power Semiconductor Device in the Renewable Energy System In deutscher Sprache. pages.

paperback. Etat : New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Etat : New. In English.

Etat : New. In English.

Etat : New.

Etat : New.

Etat : As New. Unread book in perfect condition.

Etat : As New. Unread book in perfect condition.

Etat : New. Proceedings of the NATO Advanced Research Workshop, Heraklion, Crete, Greece, June 4-9, 1989 Editor(s): Christou, A.; Unger, B.A. Series: NATO Science Series E. Num Pages: 585 pages, biography. BIC Classification: TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 31. Weight in Grams: 1000. . 1989. Hardback. . . . .…

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis cussed. A brief review of these sessions is presented in this book.…

Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis cussed. A brief review of these sessions is presented in this book.…

Paperback. Etat : Brand New. 1990 edition. 588 pages. 9.25x6.10x1.33 inches. In Stock.

Etat : New. Proceedings of the NATO Advanced Research Workshop, Heraklion, Crete, Greece, June 4-9, 1989 Editor(s): Christou, A.; Unger, B.A. Series: NATO Science Series E. Num Pages: 585 pages, biography. BIC Classification: TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 31. Weight in Grams: 1000. . 1989. Hardback. . . . . Books ship from the US and Ireland.…

paperback. Etat : New. Semiconductor device reliability album 41050.

paperback. Etat : New. Language:Chinese.The power semiconductor device theory. characteristics and reliability (the original book version 2).

Etat : New. This essential volume, part of the Reliability Technology Series, delves into the critical methodologies and techniques for analyzing defects and failures in semiconductor devices. Published by Nikka Giren Publishing, it offers in-depth insights for professionals and researchers in electronics, manufacturing, and quality control seeking to enhance device reliability and performance. The book covers various analytical approaches, providing a comprehensive resource for understanding and resolving common and complex issues in semiconductor technology. Note: The text is entirely in Japanese. Brand New Japanese Edition. Ships worldwide from Japan via Japan Post. Expedited shipping via FedEx available.…

Etat : new. Questo è un articolo print on demand.

Etat : new. Questo è un articolo print on demand.