Vlsi test (242 résultats)

hardcover. Etat : Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Hardcover. Etat : Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

Hardcover. Etat : Very Good. No Jacket. Missing dust jacket; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Hardcover. Etat : Fine. 1st Edition. 378p, many figures in the text, a Fine hardback (with laminated boards) [0747600015].

Etat : Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.…

Hardcover. Etat : Very Good. Sorry, No international shipping on this item.Ex-Library hardcover with dj in very nice condition with the usual markings and attachments. Except for library markings, interior clean and unmarked. Tight binding.

gebundene Ausgabe. Etat : Gut. 354 Seiten; Das hier angebotene Buch stammt aus einer teilaufgelösten wissenschaftlichen Bibliothek und trägt die entsprechenden Kennzeichnungen (Rückenschild, Instituts-Stempel.); Schnitt und Einband sind etwas staubschmutzig; der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend gut. Text in ENGLISCHER Sprache! Sprache: Englisch Gewicht in Gramm: 650.…

Etat : New.

Etat : New.

Etat : New.

Etat : As New. Unread book in perfect condition.

Etat : As New. Unread book in perfect condition.

Etat : New.

Hardcover. Etat : Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.

Etat : New.

Etat : Gut. 777 S. Einband hinten leicht eingedrückt. Schnitt unten dezent fleckig. Mit Bibliothek-Stempel. 518 Sprache: Englisch Gewicht in Gramm: 1800 Gebundene Ausgabe, Maße: 20.62 cm x 5.23 cm x 23.83 cm.

Etat : New.

Etat : New.

Etat : New.

paperback. Etat : New. Paperback. Publisher: Electronic Industry Press. 2 Pub. Date :2008-06-01. VLSI testing and design for test methodology have been screening mature. many theories and methods for design and manufacturing sector. widely accepted. has become a basic feature of EDA tools. Systematic compilation of the book so far the mainstream methodology and structure for the reader to a deeper level of circuit design. simulation. testing and analysis to lay a good foundation for the circuit (including circuit-l. …

Etat : As New. Unread book in perfect condition.

Etat : As New. Unread book in perfect condition.

Etat : Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Doctoral Thesis / Dissertation from the year 2018 in the subject Computer Science - Applied, grade: 6, Anna University, course: PhD, language: English, abstract: Test data compression is an effective method for reducing test data volume and memory requirement with relatively small cost. An effective test structure for embedded hard cores is easy to implement and it is also capable of producing high-quality tests as part of the design flow.The purpose of Test data compression intends to reduce Test data volume by using Test Stimulus Compression such as Code-based schemes, Linear-decompression-based schemes and Broadcast-scan-based schemes.The research work addresses the problem of the test data volume and memory requirements. The primary objective of this study is to introduce novel techniques that improve the compression ratio by reducing test data volume during at-speed test in scan designs. This in turn diminishes the tester memory requirement and hence chip area is reduced for Built-in-Self Test environment.The aim of this research is to introduce various compression algorithms by combining the existing data compression techniques. The algorithms are designed to reduce the volume of test patterns of input that is essential to guarantee an acceptable level of fault coverage which is a key parameter to evaluate the quality of testing.…

Etat : New.

Etat : New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Etat : New. pp. 406.

Etat : New. pp. xi + 220.

Hardcover. Etat : As New. Like new, never been used.

Etat : New. pp. xi + 220 Illus.